4.1 This practice is useful as a screening basis for acceptance or rejection of transparencies during manufacturing so that units with identifiable flaws will not be carried to final inspection for rejection at that time.4.2 This practice may also be employed as a go-no go technique for acceptance or rejection of the finished product.4.3 This practice is simple, inexpensive, and effective. Flaws identified by this practice, as with other optical methods, are limited to those that produce temperature gradients when electrically powered. Any other type of flaw, such as minor scratches parallel to the direction of electrical flow, are not detectable.1.1 This practice covers a standard procedure for detecting flaws in the conductive coating (heater element) by the observation of polarized light patterns.1.2 This practice applies to coatings on surfaces of monolithic transparencies as well as to coatings imbedded in laminated structures.1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For specific precautionary statements, see Section 6.1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 515元 / 折扣价： 438 元 加购物车

This test method establishes the apparatuses to be used, specimen preparation methods, and standard procedures for determining the presence of surface flaws in tungsten-seal rods and wires of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.1.1 This test method covers the determination of the presence of surface flaws in tungsten-seal rod and wire of random or cut lengths, and in the tungsten section of multiple-piece-through leads used in electronic devices, by means of examination of a glass bead sealed to the tungsten.1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 515元 / 折扣价： 438 元 加购物车