
【国际标准】 Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report
- 标准编号: IEC 60748-23-3:2002 EN
- 标准状态:现行
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标准号:
IEC 60748-23-3:2002 EN
标准名称:
Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report
英文名称:
Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report标准状态:
现行-
发布日期:
2002-05-17 -
实施日期:
出版语种:
EN
- 其它标准
- 上一篇: IEC 60748-23-2:2002 EN 7c48b6af Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
- 下一篇: IEC 60748-23-4:2002 EN 821aab13 Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification
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