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IEC 60749-9:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
REVISED
发布日期 :
2002-04-12
实施日期 :
IEC 60749-2:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
现行
发布日期 :
2002-04-12
实施日期 :
IEC 60749-10:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
REVISED
发布日期 :
2002-04-09
实施日期 :
IEC 60749-3:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection
REVISED
发布日期 :
2002-04-09
实施日期 :
IEC 60749:1996 EN-FR
Semiconductor devices - Mechanical and climatic test methods
被代替
发布日期 :
1996-10-28
实施日期 :