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This standard defines communication modes for Near Field Communication Interface and Protocol (NFCIP 1) using inductive coupled devices operating at the centre frequency of 13,56 MHz for interconnection of computer peripherals. It also defines both the Active and the Passive communication modes of Near Field Communication Interface and Protocol (NFCIP-1) to realize a communication network using Near Field Communication devices for networked products and also for consumer equipment. This standard specifies, in particular, modulation schemes, codings, transfer speeds, and frame format of the RF interface, as well as initialization schemes and conditions required for data collision control during initialization. It also defines a transport protocol including protocol activation and data exchange methods.

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ISO/IEC 18092, ISO/IEC 14443 and ISO/IEC 15693 specify the radio frequency signal interface, initialization, anti-collision and protocols for wireless interconnection of closely coupled devices and access to contactless integrated circuit cards operating at 13,56 MHz. This Standard specifies the communication mode selection mechanism, designed not to disturb any ongoing communication at 13,56 MHz, for devices implementing ISO/IEC 18092, ISO/IEC 14443 or ISO/IEC 15693. This Standard requires implementations to enter the selected communication mode as specified in the respective Standard. The communication mode specifications, however, are outside the scope of this Standard.

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Information technology - Multimedia content description interface - Part 1: Systems AMENDMENT 1: Systems extensions

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5.1 The electrical properties of gate and field oxides are altered by ionizing radiation. The method for determining the dose delivered by the source irradiation is discussed in Practices E666, E668, E1249, and Guide E1894. The time dependent and dose rate effects of the ionizing radiation can be determined by comparing pre- and post-irradiation voltage shifts, ΔVot and ΔVit. This test method provides a means for evaluation of the ionizing radiation response of MOSFETs and isolation parasitic MOSFETs.5.2 The measured voltage shifts, ΔVot and ΔVit, can provide a measure of the effectiveness of processing variations on the ionizing radiation response.5.3 This technique can be used to monitor the total-dose response of a process technology.1.1 This test method covers the use of the subthreshold charge separation technique for analysis of ionizing radiation degradation of a gate dielectric in a metal-oxide-semiconductor-field-effect transistor (MOSFET) and an isolation dielectric in a parasitic MOSFET.2,3,4 The subthreshold technique is used to separate the ionizing radiation-induced inversion voltage shift, ΔVINV into voltage shifts due to oxide trapped charge, ΔVot and interface traps, ΔV it. This technique uses the pre- and post-irradiation drain to source current versus gate voltage characteristics in the MOSFET subthreshold region.1.2 Procedures are given for measuring the MOSFET subthreshold current-voltage characteristics and for the calculation of results.1.3 The application of this test method requires the MOSFET to have a substrate (body) contact.1.4 Both pre- and post-irradiation MOSFET subthreshold source or drain curves must follow an exponential dependence on gate voltage for a minimum of two decades of current.1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.7 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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Information Technology - Multimedia Content Description Interface - Part 1: Systems AMENDMENT 2: Fast Access Extension

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