IEC 60747-7:2010+AMD1:2019 CSV EN-FR 8f7b9109
Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
现行
发布日期 :
2019-09-23
实施日期 :
IEC 60747-8:2010 EN-FR 830c90b1
Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
现行
发布日期 :
2010-12-15
实施日期 :
IEC 60749-10:2002 EN-FR 90a64383
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
REVISED
发布日期 :
2002-04-09
实施日期 :
IEC 60749-13:2002 EN-FR ddfa00fd
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
REVISED
发布日期 :
2002-04-12
实施日期 :
IEC 60749-17:2003 EN-FR 5b486ef1
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
REVISED
发布日期 :
2003-02-20
实施日期 :