IEC 60749-3:2002 EN-FR e8a48067
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection
REVISED
发布日期 :
2002-04-09
实施日期 :
IEC 60749-6:2002 EN-FR d05291bd
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
REVISED
发布日期 :
2002-04-12
实施日期 :
IEC 60749-9:2002 EN-FR 0a33cdfc
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
REVISED
发布日期 :
2002-04-12
实施日期 :