IEC 60749-10:2002 EN-FR 90a64383
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
REVISED
发布日期 :
2002-04-09
实施日期 :
IEC 60749-13:2002 EN-FR ddfa00fd
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
REVISED
发布日期 :
2002-04-12
实施日期 :
IEC 60749-17:2003 EN-FR 5b486ef1
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
REVISED
发布日期 :
2003-02-20
实施日期 :