This standard specifies the instrumented nanoindentation test methods for measuring the indentation hardness and modulus of thin film.
This standard is applicable to thin film adhering to solid surface.The indentation direction is perpendicular to the sample surface.The depth range of indentation is usually manometers and can be also extended to several micrometers.
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This standard specifies the capability requirements and basic test methods for instrumented nanoindentation test instruments,also specifies the requirements for instrument calibration and inspection,indenter and reference materials,and the determined method of instrument compliance and indenter area function.This standard gives the data analysis methods for determining hardness and material parameters and cautions for use of indenter.
This standard is applicable to measure hardness and modulus etc.of various bulk materials and thin films.The range of the indentation depth is generally at nanoscale and can be also extended to several micrometers.
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