定价： 0元 / 折扣价： 0 元 加购物车

定价： 481元 / 折扣价： 409 元 加购物车

定价： 481元 / 折扣价： 409 元

定价： 481元 / 折扣价： 409 元

1.1 This terminology standard defines abbreviations and terms specific to uninsulated electrical conductors. For terms relating to superconductors, see Terminology B713.1.2 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 590元 / 折扣价： 502 元 加购物车

This specification covers aluminum 1350-H19, 1350-H16 or -H26, 1350-H14 or -H24, 1350-H142 or -H242, and aluminum alloy 8XXX series for tempers "O" and H1X or H2X, bare stranded conductors composed of one or more roller shaped or die compressed layers of helically laid wires. The conductors are for general use for electrical purposes. The conductors described in this specification are intended for subsequent insulation or covering. The areas of cross section, the minimum number of wires, and diameters of the finished strand shall conform to the prescribed construction requirements. The rated strength of 1350-H19 conductors shall be taken as the percent of the sum of the strengths of the component wires, calculated using the nominal wire diameters and the specified minimum average tensile strength. The rated strength of 800 series conductors shall be taken as the percent of the sum of strengths of the component wires, calculated using nominal wire diameters and the specified minimum average tensile strength. The approximate mass and electrical resistance may be determined using the standard increments due to stranding. Mechanical and electrical tests shall be made for not annealed and annealed conductors after stranding. Temperature correction factors for conductor resistance shall be provided when dc resistance is measured at specified temperatures.1.1 This specification covers aluminum 1350-H19 (extra hard), 1350-H16 or -H26 (3/4 hard), 1350-H14 or -H24 (1/2 hard), 1350-H142 or -H242 (1/2 hard), and aluminum alloy 8XXX series as listed in Specification B800 for tempers “O” and H1X or H2X, bare stranded conductors composed of one or more roller shaped or die compressed layers of helically layed wires. The conductors are for general use for electrical purposes (Explanatory Notes 1 and 2).NOTE 1: For the purposes of this specification, single input wire (SIW) construction is defined as follows: a stranded conductor design methodology that varies the number of wires within a range of conductor sizes in order to permit that range of conductor sizes to be constructed from a single wire size.1.2 The SI values for resistivity are regarded as standard. For all other properties, the inch-pound units are regarded as standard and the SI units may be approximate.NOTE 2: Prior to 1975, aluminum 1350 was designated as EC aluminum.NOTE 3: The aluminum and temper designations conform to ANSI H35.1. Aluminum 1350 corresponds to Unified Numbering System A91350 in accordance with Practice E527. Aluminum alloys in the 8000 series correspond to Unified Numbering System A98XXX in accordance with Practice E527.NOTE 4: This specification also permits conductors for use as covered or insulated electrical conductors.NOTE 5: Sealed conductors, which are intended to prevent longitudinal water propagation and are further covered/insulated, are also permitted within the guidelines of this specification.1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 590元 / 折扣价： 502 元 加购物车

This specification covers stranded conductors made from round copper wires, either uncoated or coated with tin, lead, or lead alloy for general use in insulated conductor assemblies for electrical purposes. These conductors shall be composed of one or more roller shaped or die closed layers of helically laid wires using the single input wire. For stranded conductors, the direction of lay of the outer layer shall be leeft hand and may be reversed or unidirectional/unilay in successive layers. Test for the physical and electrical properties of wires composing conductors made from hard-drawn or medium-hard-drawn wires, uncoated or coated, shall be made before but not after stranding. For the purpose of calculating mass, cross sections, and so forth, the density of the copper shall be taken. The mass and electrical resistance of a unit length of stranded unsealed conductor are a function of the lenght of lay shall be calculated.1.1 This specification covers stranded conductors made from round copper wires, either uncoated or coated with tin, lead, or lead alloy for general use in insulated conductor assemblies for electrical purposes. These conductors shall be composed of one or more roller shaped or die closed layers of helically laid wires using the single input wire (SIW) methodology. (see Note 1 and Explanatory Note 1)NOTE 1: Sealed conductors which are intended to prevent longitudinal water propagation and are further covered/insulated, are also permitted within the guidelines of this specification.1.2 The values stated in inch-pound or SI units are to be regarded separately as standard. The values in each system are not exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in nonconformance with the specification.1.2.1 For density, resistivity, and temperature, the values stated in SI units are to be regarded as standard.1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 590元 / 折扣价： 502 元 加购物车

5.1 Applying Test Method F390 to large flat panel substrates presents a number of serious difficulties not anticipated in the development of that standard. The following problems are encountered.5.1.1 The four-point probe method may be destructive to the thin film being measured. Sampling should therefore be taken close to an edge or corner of the plate, where the film is expendable. Special geometrical correction factors are then required to derive the true sheet resistance.5.1.2 Test Method F390 is limited to a conventional collinear probe arrangement, but a staggered collinear and square arrays are useful in particular circumstances. Correction factors are needed to account for nonconventional probe arrangements.5.1.3 Test Method F390 anticipates a precision testing arrangement in which the probe mount and sample are rigidly positioned. There is no corresponding apparatus available for testing large glass or plastic substrates. Indeed, it is common in flat panel display making that the probe is hand held by the operator.5.1.4 It is difficult, given the conditions cited in 5.1.3, to ensure that uniform probe spacing is not degraded by rough handling of the equipment. The phased square array, described, averages out probe placement errors.5.1.5 This practice is estimated to be precise to the following levels. Otherwise acceptable precision may be degraded by probe wobble, however (see 8.6.4).5.1.5.1 As a referee method, in which the probe and measuring apparatus are checked and qualified before use by the procedures of Test Method F390 paragraph 7 and this practice, paragraph 8: standard deviation, s, from measured sheet resistance, RS, is ≤ 0.01 RS.5.1.5.2 As a routine method, with periodic qualifications of probe and measuring apparatus by the procedures of Test Method F390 paragraph 7 and this practice, paragraph 8: standard deviation, s, from measured sheet resistance, RS, is ≤ 0.02 RS.1.1 This practice describes methods for measuring the sheet electrical resistance of sputtered thin conductive films deposited on large insulating substrates, used in making flat panel information displays. It is assumed that the thickness of the conductive thin film is much thinner than the spacing of the contact probes used to measure the sheet resistance.1.2 This standard is intended to be used with Test Method F390.1.3 Sheet resistivity in the range 0.5 to 5000 ohms per square may be measured by this practice. The sheet resistance is assumed uniform in the area being probed.1.4 This practice is applicable to flat surfaces only.1.5 Probe pin spacings of 1.5 mm to 5.0 mm, inclusive (0.059 to 0.197 in inclusive) are covered by this practice.1.6 The method in this practice is potentially destructive to the thin film in the immediate area in which the measurement is made. Areas tested should thus be characteristic of the functional part of the substrate, but should be remote from critical active regions. The method is suitable for characterizing dummy test substrates processed at the same time as substrates of interest.1.7 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

定价： 0元 / 折扣价： 0 元

定价： 590元 / 折扣价： 502 元 加购物车

5.1 This test method establishes the requirements for a standardized method of evaluating the performance of crimped-type electrical connections having solid or stranded conductors.5.2 In order to achieve a successful crimped connection, the crimping tool must deform the material of the crimp barrel or barrel tab(s) around the conductor. As a consequence, the conductor surfaces are placed under compression by the crimp terminal and areas of contact are established between the conductor and the crimp barrel. These areas provide the desired electrical connection. A reliable crimped connection is one that is capable of maintaining the contact between the conductor and crimp barrel so that a stable electrical connection is maintained when it is exposed to the conditions it was designed to endure during its useful life.5.3 Evaluation testing is designed to ensure that a particular design crimped connection system consisting of conductor and component and associated tooling is capable of achieving a reliable electrical and mechanical connection. After the evaluation is completed, if any change in the system parts is made, the system should be reevaluated using the same procedures.5.4 After completion of the evaluation test, the tensile pull strength results may be used to develop acceptance requirements to be used in inspection of subsequent production lots of crimped connections. An example of such an acceptance requirement is shown in Appendix X1.5.5 The aging test, 33 days exposure at 118°C, has been used in the telecommunications industry to simulate 40 years of service at a moderately elevated temperature of 50°C, an environment that components experience within large banks of telephone equipment. This environment is similar to that seen in a wide range of electronic systems operating indoors containing active components that dissipate power. The test is designed to reproduce the stress relaxation of copper alloys in such service and has been used extensively in evaluating wire wrap connections. It also accelerates other thermally activated processes such as oxidation although their acceleration factors may be different from that of copper stress relaxation.5.6 The aging test accelerates stress relaxation processes and other thermally activated processes but does not address some other possible hazards such as corrosion. Additional testing may be appropriate if the intended service environment presents such hazards.1.1 This test method establishes the requirements for a standardized method of evaluating the quality of crimped-type electrical connections to solid or stranded conductors. This test method applies to 16-gauge and smaller diameter copper wire, coated or uncoated.1.2 This test method is applicable to connection systems intended for indoor use, or for use in environmentally protected enclosures. Additional testing may be required to assure satisfactory performance in applications where high humidity or corrosive environment, or both, may be present.1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to become familiar with all hazards including those identified in the appropriate Safety Data Sheet (SDS) for this product/material as provided by the manufacturer, to establish appropriate safety, health, and environmental practices, and determine the applicability of regulatory limitations prior to use.1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 590元 / 折扣价： 502 元 加购物车

定价： 590元 / 折扣价： 502 元 加购物车

定价： 590元 / 折扣价： 502 元 加购物车

定价： 590元 / 折扣价： 502 元 加购物车

定价： 590元 / 折扣价： 502 元 加购物车

定价： 515元 / 折扣价： 438 元 加购物车