5.1 Applying Test Method F390 to large flat panel substrates presents a number of serious difficulties not anticipated in the development of that standard. The following problems are encountered.5.1.1 The four-point probe method may be destructive to the thin film being measured. Sampling should therefore be taken close to an edge or corner of the plate, where the film is expendable. Special geometrical correction factors are then required to derive the true sheet resistance.5.1.2 Test Method F390 is limited to a conventional collinear probe arrangement, but a staggered collinear and square arrays are useful in particular circumstances. Correction factors are needed to account for nonconventional probe arrangements.5.1.3 Test Method F390 anticipates a precision testing arrangement in which the probe mount and sample are rigidly positioned. There is no corresponding apparatus available for testing large glass or plastic substrates. Indeed, it is common in flat panel display making that the probe is hand held by the operator.5.1.4 It is difficult, given the conditions cited in 5.1.3, to ensure that uniform probe spacing is not degraded by rough handling of the equipment. The phased square array, described, averages out probe placement errors.5.1.5 This practice is estimated to be precise to the following levels. Otherwise acceptable precision may be degraded by probe wobble, however (see 8.6.4).5.1.5.1 As a referee method, in which the probe and measuring apparatus are checked and qualified before use by the procedures of Test Method F390 paragraph 7 and this practice, paragraph 8: standard deviation, s, from measured sheet resistance, RS, is ≤ 0.01 RS.5.1.5.2 As a routine method, with periodic qualifications of probe and measuring apparatus by the procedures of Test Method F390 paragraph 7 and this practice, paragraph 8: standard deviation, s, from measured sheet resistance, RS, is ≤ 0.02 RS.1.1 This practice describes methods for measuring the sheet electrical resistance of sputtered thin conductive films deposited on large insulating substrates, used in making flat panel information displays. It is assumed that the thickness of the conductive thin film is much thinner than the spacing of the contact probes used to measure the sheet resistance.1.2 This standard is intended to be used with Test Method F390.1.3 Sheet resistivity in the range 0.5 to 5000 ohms per square may be measured by this practice. The sheet resistance is assumed uniform in the area being probed.1.4 This practice is applicable to flat surfaces only.1.5 Probe pin spacings of 1.5 mm to 5.0 mm, inclusive (0.059 to 0.197 in inclusive) are covered by this practice.1.6 The method in this practice is potentially destructive to the thin film in the immediate area in which the measurement is made. Areas tested should thus be characteristic of the functional part of the substrate, but should be remote from critical active regions. The method is suitable for characterizing dummy test substrates processed at the same time as substrates of interest.1.7 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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5.1 The color displayed on a VDU is an important aspect of the reproduction of colored images. The VDU is often used as the design, edit, and approval medium. Images are placed into the computer by some sort of capture device, such as a camera or scanner, modified by the computer operator, and sent on to a printer or color separation generator, or even to a paint dispenser or textile dyer. The color of the final product is to have some well-defined relationship to the original. The most common medium for establishing the relationship between input, edit, and output color (device-independent color space) is the CIE tristimulus space. This guide identifies the procedures for deriving a model that relates the digital computer settings of a VDU to the CIE tristimulus values of the colored light emitted by the primaries.1.1 This guide is intended for use in establishing the operating characteristics of a visual display unit (VDU), such as a cathode ray tube (CRT). Those characteristics define the relationship between the digital information supplied by a computer, which defines an image, and the resulting spectral radiant exitance and CIE tristimulus values. The mathematical description of this relationship can be used to provide a nearby device-independent model for the accurate display of color and colored images on the VDU. The CIE tristimulus values referred to here are those calculated from the CIE 1931 2° standard colorimetric (photopic) observer.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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5.1 This practice may be applied when tristimulus colorimeters are used to measure the colors produced on self-luminous video display devices such as CRTs and flat-panel displays, including electroluminescent (EL) panels, light emitting diodes (LEDs) field emission displays (FEDs), and back-lit liquid crystal displays (LCDs). This practice is not meant to be a complete description of a procedure to measure the color coordinates of a display. Rather, it provides a method for obtaining more accurate results when certain conditions are met. It may be used by any person engaged in the measurement of color on display devices who has access to the requisite equipment.5.2 This practice defines a class of tristimulus colorimeters that may be said to be compatible with this practice.1.1 This practice is intended as an aid for improving the accuracy of colorimetric measurements made with tristimulus colorimeters on visual display units, such as cathode ray tubes (CRTs) and self-luminous flat-panel displays. It explains a useful step in the analysis of colorimetric data that takes advantage of the fact that light from such displays consists of an additive mixture of three primary colored lights. However, it is not a complete specification of how such measurements should be made.1.2 This practice is limited to display devices and colorimetric instruments that meet linearity criteria as defined in the practice. It is not concerned with effects that might cause measurement bias such as temporal or geometric differences between the instrument being optimized and the instrument used for reference.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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4.1 Resistivity is a primary quantity for characterization and specification of coated glass plates used for flat panel displays. Sheet resistance is also a primary quantity for characterization, specification, and monitoring of thin film fabrication processes.4.2 This practice requires no specimen preparation.4.3 The eddy current method is non-destructive to the thin film being measured. Special geometrical correction factors, needed for some four-point probe electrical resistivity measurements, are not required to derive the true sheet resistance so long as the transducers have a continuous layer of conductive thin film between them.4.4 Test Methods F673 refers to a testing arrangement in which the transducers and specimen (a semiconductor grade silicon wafer) are rigidly positioned. Similar apparatus is commercially available for testing large glass or plastic substrates, not envisioned in the scope of Test Methods F673. A hand held probe can also be used, depending on throat depth required.4.5 For use as a referee method, the probe and measuring apparatus must first be checked and qualified before use by the procedures of Test Methods F673 (9.1.1 through 9.1.3 and 9.1.4.2 through 9.1.4.5), then this practice is used.4.6 For use as a routine quality assurance method, this practice may be employed with periodic qualifications of probe and measuring apparatus by the procedures of Test Methods F673 (9.1.1 through 9.1.3 and 9.1.4.2 through 9.1.4.5). The parties to the test must agree upon adequate qualification intervals for the test apparatus.1.1 This practice describes methods for measuring the sheet electrical resistance of sputtered thin conductive films deposited on large insulating substrates (glass or plastic), used in making flat panel information displays.1.2 This practice is intended to be used with Test Methods F673. This practice pertains to a “manual” measurement procedure in which an operator positions the measuring head on the test specimen and then personally activates the test apparatus. The resulting test data may be tabulated by the operator, or, alternatively, sent to a computer-based data logging system. Both Methods I and II of Test Methods F673 (paragraphs 3.1 through 3.3.3 of Test Methods F673) are applicable to this practice.1.3 Sheet resistivity in the range 0.020 to 3000 Ω per square (sheet conductance in the range 3 by 10–4 to 50 mhos per square) may be measured by this practice. The sheet resistance is assumed to be uniform in the area being probed.NOTE 1: Typical manual test units, as described in this practice, measure and report in the units “mhos per square”; this is the inverse of “ohms per square.”1.4 This practice is applicable to flat surfaces only.1.5 This practice is non-destructive. It may be used on production panels to help assure production uniformity.1.6 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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5.1 The most fundamental method for obtaining CIE tristimulus values or other color coordinates for describing the colors of visual display units (VDUs) is by the use of spectroradiometric data. (See CIE No. 18 and 63.) These data are used by summation together with numerical values representing the 1931 CIE Standard Observer and normalized to Km, the maximum spectral luminous efficacy function.5.2 The special requirements for characterizing VDUs possessing narrow or discontinuous spectra are presented and discussed. Modifications to the requirements of Practice E308 are given to correct for the unusual nature of narrow or discontinuous sources.1.1 This test method prescribes the instrumental measurements required for characterizing the color and brightness of VDUs.1.2 This test method is specific in scope rather than general as to type of instrument and object.1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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