This Recommended Practice provides safety precautions, installation design considerations, and procedures for commissioning, maintenance, and storage of pocket and fiber-plate nickel-cadmium storage batteries for photovoltaic (PV) power systems. Disposal and recycling recommendations are also discussed. While this document gives general recommended practices, battery manufacturers can provide specific instructions for battery installation and maintenance.

定价： 87元 / 折扣价： 74 元

This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload, and a distribution architecture for converting the test data to/from on-chip test structures. The standard re-uses existing high speed I/O (HSIO) known in the industry for the high speed test access port (HSTAP). The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different integrated circuits (ICs) that host different HSIO technology, such that the standard addresses as large a part of the industry as possible. The scope includes IEEE 1149.1 Boundary-Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation, which can be used for configuring a mission mode HSIO to a test mode compatible with the HSTAP. The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.

定价： 104元 / 折扣价： 89 元

This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing of interconnections in the conventional sense of IEEE Std 1149.1-2001, the mixed-signal test bus defined by this standard also provides the means for… read more parametric testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) as a means of describing key aspects of the implementation of this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard. read less

定价： 242元 / 折扣价： 206 元

This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.16 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing interconnections in the conventional sense of IEEE Std 1149.1, the mixed-signal test bus defined by this standard also provides the means for parametric… read more testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) to describe key aspects of implementing this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard. read less

定价： 120元 / 折扣价： 102 元

This specification is designed for use in conjunction with other families of documents such as IEEE Std1101.x, IEEE Standard for Mechanical Core Specifications for Microcomputers; IEEE Std 896.x, IEEE Standard Backplane Bus Specification for Multiprocessor Architectures: Futurebus+; IEEE Std 1596-1992, IEEE Standard for Scalable Coherent Interface (SCI); IEEE Std 1014-1987, IEEE Standard for a Versatile Backplane Bus: VMEbus; IEEE Std 1296-1987, IEEE Standard for a High-Performance Synchronous 3… read more 2-Bit Bus: MULTIBUS®2 II; and IEEE Std 1301-1991, IEEE Standard for a Metric Equipment Practice for Microcomputers—Coordinating Document. This standard is intended to be used as a core specification. It contains the minimum environmental withstand conditions that are applicable to computer modules/circuit boards and all of the components attached to those modules. It has been created to provide general environmental withstand conditions for one or more of the previously listed computer buses or interconnect standards. It may also apply to electronic equipment in general. read less

定价： 150元 / 折扣价： 128 元

This specification is designed for use in conjunction with other documents such as IEEE 1101.n (Mechanical Specification for Micro Connectors and Eurocard Form Factors), IEEE 896.n (Futurebus+), IEEE 1596 (Scalable Coherent Interface), IEEE 1014 (VME Bus), and IEEE 1296 (Multi Bus II). This standard is intended to be used as a core specification. It contains minimum environmental withstand conditions applicable to computer systems and all of their associated components. It has been created to… read more provide general environmental withstand conditions for one or more of the above listed computer buses or interconnect standards, and electronic equipment in general. While this document was specifically created for use with IEEE Computer Society bus standards, nothing herein is intended to restrict its use for other applications, where applicable. A supplier and user may agree to more or less restrictive environmental specifications than those listed below. However, if their specifications are less restrictive than those listed herein, neither supplier nor user may claim conformance to this document. read less

定价： 143元 / 折扣价： 122 元

This standard will be designed for use in conjunction with P896.10 (Spaceborne Futurebus+ Profile Specifications) for specification of environmental withstand conditions applicable to spaceborne computer modules/circuit boards and all of the components attached to the modules.

定价： 146元 / 折扣价： 125 元

This recommended practice specifies the PQDIF file format for the transfer of power quality data between instruments and computers. This includes raw, processed, simulated, proposed, specified, and calculated data. The transfer file format includes the power quality measurements as well as appropriate characterization parameters, such as sampling rate, resolution, calibration status, instrument identification, location, and other related data or characteristics. The recommended practice also… read more provides guidelines for transferring power quality data. read less

定价： 160元 / 折扣价： 136 元

定价： 61元 / 折扣价： 52 元

This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm-3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19

定价： 165元 / 折扣价： 141 元

This project defines a serial, full-duplex, asynchronous, 9-pin DTE communications port that follows EIA 574 and related standards. Portions of several standards will be referenced along with specific extensions applying to programmable instruments. The resulting draft will apply to point-to-point instrument systems composed of a measurement, stimulus or interconnect device and an instrumentation controller. It may also apply to certain devices outside the scope of the instrument system… read more environment. The document will cover mechanical, electrical and functional requirements of the interface. read less

定价： 130元 / 折扣价： 111 元

定价： 110元 / 折扣价： 94 元

This guide describes the scope of application and interrelationships for the members of the IEEE 1175 family of standards, and it points the reader to the appropriate standards for clarifying issues involved in effectively integrating computing system tools into a productive engineering environment.

定价： 109元 / 折扣价： 93 元

Identify a standard set of attributes that characterize the contexts in which a CASE tool operates. These contexts are organizations, users, platforms, and other tools. The attributes in each context summarize the major factors affecting interconnection of the tool with that context. These are multi-dimensional attributes whose "values" are project-specific, organization-specific, professional, military and/or international standards for these attributes are identified. This is an expansion of… read more Section 2 of the original 1175-1995 standard. read less

定价： 110元 / 折扣价： 94 元

Identify a common set of modeling concepts found in commercial CASE tools for describing the operational behavior of software product. Establish a uniform, integrated model and a textual syntax c for expressing the common properties (attributes and relationships) of those concepts as they have been used to model software behavior. This is a minor revision of Part 3 of the original standard. It is still useful within its defined scope.

定价： 141元 / 折扣价： 120 元