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1 Scope This part of ISO/IEC 11694 defines the dimensions and location of the accessible optical area of optical memory cards with ID-1 dimensions using the linear recording method.

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This part of ISO/IEC 11694 defines the dimensions and location of the accessible optical area of optical memory cards with ID-1 dimensions using the linear recording method.

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This part of ISO/IEC 11694 specifies the use of biometric data on optical memory cards using the logical data structure defined in ISO/IEC 11694-5.

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1.1 This test method covers the measurement of MOSFET (see Note 1) linear threshold voltage under very low sweep rate or d-c conditions. It is a d-c conductance method applicable in the linear region of MOSFET operation where a drain voltage V D of approximately 0.1 V is typical.Note 1--MOS is an acronym for metal-oxide semiconductor; FET is an acronym for field-effect transistor.1.2 This test method is applicable to both enhancement-mode and depletion-mode MOSFETs, and for both silicon-on-insulator (SOI) and bulk-silicon MOSFETs. The test method specifies positive voltage and current conventions specifically applicable to n-channel MOSFETs. The substitution of negative voltage and negative current make the test method directly applicable to p-channel MOSFETs.1.3 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this test method.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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定价： 260元 / 折扣价： 221 元

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1.1 This test method covers determination of the coefficient of linear thermal expansion of electrical insulating materials by use of a thermomechanical analyzer.1.2 This test method is applicable to materials that are solid over the entire range of temperature used, and that retain sufficient hardness and rigidity over the temperature range so that irreversible indentation of the specimen by the sensing probe does not occur.1.3 Transition temperatures also may be obtained by this test method.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.1.5 The values stated in SI units are the standard.Note 1--There is no similar or equivalent ISO/IEC standard.

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5.1 There are many kinds of linear integrated circuits. Any given linear integrated circuit may be used in a variety of ways and under various operating conditions within the limits of performance specified by the manufacturer. The procedures of this practice provide a standardized way to measure the dose-rate response of a linear integrated circuit, under operating conditions similar to those of the intended application, when the circuit is exposed to pulsed ionizing radiation.5.2 Knowledge of the responses of linear integrated circuits to radiation pulses is essential for the design, production, and maintenance of electronic systems that are required to operate in the presence of pulsed radiation environments.1.1 This practice covers the measurement of the response of linear integrated circuits, under given operating conditions, to pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation.1.3 The test may be considered to be destructive either for further tests or for other purposes if the total radiation ionizing dose exceeds some predetermined level or if the part should latch up. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test. (See 6.10.)1.4 Setup, calibration, and test circuit evaluation procedures are included in this practice.1.5 Procedures for lot qualification and sampling are not included in this practice.1.6 Because response varies with different device types, the dose rate range and device upset conditions for any specific test is not given in this practice but must be agreed upon by the parties to the test.1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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5.1 Information concerning the thermal expansion characteristics of rocks is important in the design of underground excavation where the temperature of the surrounding rock may be altered. Depending on the restraint conditions, thermal strain may cause thermal stress that may affect the stability of underground excavations. Examples of applications where an understanding of rock thermal strain is important include: nuclear waste repositories, underground power stations, compressed air energy storage facilities, energy foundations, and geothermal energy facilities.5.2 The coefficient of linear thermal expansion, α, of rock is known to vary as the temperature changes. Rock thermal strain is normally not a linear function of temperature. This test method provides a procedure for continuously monitoring thermal strain as a function of temperature. Therefore, information on how the coefficient of linear thermal expansion changes with temperature is obtained.5.3 Other methods of measuring the coefficient of linear thermal expansion of rock by averaging the thermal strain of a large specimen over a temperature range of many degrees may result in failure to determine the variation in α of that rock for one or more of the following reasons:5.3.1 α is not always linear with temperature,5.3.2 Some rocks are anisotropic having directional characteristics which can vary by more than a factor of two. If anisotropy is expected, specimen with different orientations should be prepared and tested.5.3.3 α may have a negative value in one direction and, at the same time, a positive value in the others.5.4 Both wire and foil type strain gauges have been successfully employed to measure the thermal expansion coefficients of rock. These coefficients are frequently very small, being on the order of millionths of a millimetre per millimetre for each degree Celsius. The thermal strain of rocks is about one-tenth that of plastics and one-half or one-quarter that of many metals. Therefore, measurement methods for rocks require greater precision than methods that are routinely used on plastics and metals.NOTE 4: The quality of the results produced by this standard is dependent on the competence of the personnel performing it, and the suitability of the equipment and facilities used. Agencies that meet the criteria of Practice D3740 are generally considered capable of competent and objective testing/sampling/inspection/etc. Users of this standard are cautioned that compliance with Practice D3740 does not in itself ensure reliable results. Reliable results depend on many factors; Practice D3740 provides a means of evaluating some of those factors.1.1 This test method covers the laboratory determination of the linear (one-dimensional) coefficient of thermal expansion of rock using bonded electric resistance strain gauges. This test method is intended for evaluation of intact rock cores. Discontinuities in the rock mass, such as joints, inclusions, voids, veins, bedding, and the like can influence the thermal expansion of the rock, and judgment should be used when selecting the specimen to be analyzed in this test method.1.2 This test method is applicable for unconfined stress states over the temperature range from 20 to 260°C.NOTE 1: Unconfined tests performed at elevated temperatures may alter the mineralogy or grain structure of the test specimen. This alteration may change the physical and thermal properties of the test specimen.NOTE 2: The strain gauges are mounted with epoxy. Most commercially available high temperature epoxies require elevated temperature curing. The elevated temperature required for this curing may alter the physical and thermal properties of the test specimen. Epoxy should be selected based upon the maximum expected test temperature. Room temperature curing epoxy should be used whenever practical.1.3 The test specimens may be either saturated, dry or unsaturated. If saturated or unsaturated specimens are used, then the test temperature shall be at least 10°C less than the boiling point of the saturating fluid in order to reduce the effects of evaporation of the fluid.NOTE 3: When testing a saturated specimen, the gravimetric water content of the specimen may change unless special precautions are taken to encapsulate the test specimen. Refer to 7.4.1.4 Units—The values stated in SI units are to be regarded as the standard. No other units of measurement are included in this standard.1.5 All observed and calculated values shall conform to the guidelines for significant digits and rounding established in Practice D6026.1.5.1 The procedure used to specify how data are collected/recorded or calculated in this standard are regarded as the industry standard. In addition, they are representative of the significant digits that generally should be retained. The procedures used do not consider material variation, purpose for obtaining the data, special purpose studies, or any considerations for the user’s objectives; and it is common practice to increase or reduce significant digits of reported data to be commensurate with these considerations. It is beyond the scope of this standard to consider significant digits used in analytical methods for engineering design.1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.

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1.1 This test method covers the determination of linear density and maturity index of loose randomized cotton fibers by measuring the resistance to air flow of a plug of cotton fibers under two prescribed conditions. Note 1-For other methods for determining linear density and maturity properties of cotton fibers, see Test Methods D1442, D1448, D1769, D2480, D3817, British Standards BS 2016, BS 3085, and ISO 2403. 1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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4.1 Materials scientists and engineers are making increased use of statistical analyses in interpreting S-N and ε-N fatigue data. Statistical analysis applies when the given data can be reasonably assumed to be a random sample of (or representation of) some specific defined population or universe of material of interest (under specific test conditions), and it is desired either to characterize the material or to predict the performance of future random samples of the material (under similar test conditions), or both. 1.1 This guide covers only S-N and ε-N relationships that may be reasonably approximated by a straight line (on appropriate coordinates) for a specific interval of stress or strain. It presents elementary procedures that presently reflect good practice in modeling and analysis. However, because the actual S-N or ε-N relationship is approximated by a straight line only within a specific interval of stress or strain, and because the actual fatigue life distribution is unknown, it is not recommended that (a) the S-N or ε-N curve be extrapolated outside the interval of testing, or (b) the fatigue life at a specific stress or strain amplitude be estimated below approximately the fifth percentile (P ≃ 0.05). As alternative fatigue models and statistical analyses are continually being developed, later revisions of this guide may subsequently present analyses that permit more complete interpretation of S-N and ε-N data. 1.2 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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