6.1 The primary goal of this practice is to extract representative samples from PV modules for TCLP toxicity testing purposes in order to receive unbiased, comparable and repeatable toxicity test results from independent TCLP testing laboratories.6.2 Solar photovoltaic (PV) modules in the United States and the world reaching end-of-life due to failure, underperformance or breakage due to extreme weather have to be recycled or otherwise safely disposed of following the Resource Conservation and Recovery Act (RCRA) regulation [United States, Resource Conservation and Recovery Act. Pub.L. 94–580, October 1976]. For end-of-life PV modules, the U.S. Environmental Protection Agency (EPA) Method 1311 (TCLP) is used for waste characterization based on leaching potential under simulated landfill conditions.6.3 Commercial PV modules contain compounds and alloys of various metals (for example, Ag, Al, Cd, Cu, Ga, In, Ni, Pb, Se, Sn, Te, Zn) which are used in semiconductor compounds and electrical contacts.5 Modules that pass the EPA Method 1311 TCLP test, and state protocols (if applicable), can be disposed of in a regular landfill. Otherwise, they are classified as hazardous waste and must go through a more onerous and expensive disposal process. Currently, there is no national or international standard, nor a standardized protocol available for removal of test samples from PV modules for toxicity testing per the EPA Method 1311 standard.6.4 The validity of the toxicity test results heavily depends on the location of extracted samples in the module, specifically within the laminate area, and the particle size of the extracted samples. Therefore, it is critical that the sample extraction procedure be properly designed to avoid biased or otherwise inaccurate toxicity test results.6.5 The development and application of a homogeneous and representative sampling standard will help utilities and manufacturers to limit the number of variables and to obtain repeatable test results.1.1 The purpose of this practice is to describe a representative and repeatable sample preparation methodology to conduct toxicity testing on solar photovoltaic (PV) modules for use with EPA Test Method 1311: Toxicity Characteristic Leaching Procedure (TCLP).1.2 This practice refers to the extraction and preparation of PV module samples by EPA Method 1311, the testing for eight (8) distinct metals – mercury (by Method 7470A), arsenic, barium, cadmium, chromium, lead, selenium and silver (by Method 6010C) as well as the analysis and interpretation of the test results on a module level.1.3 This practice applies to only (1) standard crystalline silicon (c-Si) modules, multi and mono-crystalline silicon with aluminum back surface field (Al-BSF) cell technology and (2) cadmium telluride (CdTe) PV modules.1.4 Other and newer PV technologies and module architectures, for example, passivated emitter and rear cell (PERC), interdigitated back contact (IBC), hetero-junction technology (HJT), multiwire, half cut, shingled etc., have not been evaluated with this practice, although the concept and practice can be easily extended and applied to other technologies following the conceptual approach presented in this document.1.5 The sample extraction/removal methodology applied in this practice is the waterjet cutting sampling method. Sample extraction with mechanical cutting has been extensively evaluated but the variability of TCLP test results based on the mechanical cut samples tend to be much higher (30 %) than that of the waterjet cut samples (8 %).2 Therefore, the mechanical cut method is not presented in this practice.1.6 Only the laminate area of the PV module is considered for TCLP testing, as other possible module parts, such as aluminum frame, junction box and cables contain recyclable materials that are already well-documented and are not specific to the PV modules.1.7 The material gravimetric density (g/cm3) throughout the laminate area is considered constant.1.8 This practice was developed to be consistent with three fundamental requirements:1.8.1 Sample pieces with particle size not to exceed the allowed size limit of EPA 1311 standard which is 9.5 mm,1.8.2 The particle size used in this practice as sample piece is consistent with the median particle size expected in landfill disposal2, and1.8.3 An assumption that each laminate sample piece will result in 100 % glass coverage area, due to the presence of bonding encapsulant layers once it is broken in the landfill.1.9 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.10 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.11 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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1.1 This terminology pertains to photovoltaic (radiant-to-electrical energy conversion) device performance measurements and is not a comprehensive list of terminology for photovoltaics in general.1.2 Additional terms used in this terminology and of interest to solar energy may be found in Terminology E 772.

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5.1 The calculated error in the photovoltaic device current determined from the spectral mismatch parameter can be used to determine if a measurement will be within specified limits before the actual measurement is performed.5.2 The spectral mismatch parameter also provides a means of correcting the error in the measured device current due to spectral mismatch.5.2.1 The spectral mismatch parameter is formulated as the fractional error in the short-circuit current due to spectral and temperature differences.5.2.2 Error due to spectral mismatch is corrected by multiplying a reference cell’s measured short-circuit current by M , a technique used in Test Methods E948 and E1036.5.3 Because all spectral quantities appear in both the numerator and the denominator in the calculation of the spectral mismatch parameter (see 8.1), multiplicative calibration errors cancel, and therefore only relative quantities are needed (although absolute spectral quantities may be used if available).5.4 Temperature-dependent spectral mismatch is a more accurate method to correct photovoltaic current measurements compared with fixed-value temperature coefficients.31.1 This test method provides a procedure for the determination of a spectral mismatch parameter used in performance testing of photovoltaic devices.1.2 The spectral mismatch parameter is a measure of the error introduced in the testing of a photovoltaic device that is caused by the photovoltaic device under test and the photovoltaic reference cell having non-identical quantum efficiencies, as well as mismatch between the test light source and the reference spectral irradiance distribution to which the photovoltaic reference cell was calibrated.1.2.1 Examples of reference spectral irradiance distributions are Tables E490 or G173.1.3 The spectral mismatch parameter can be used to correct photovoltaic performance data for spectral mismatch error.1.4 Temperature-dependent quantum efficiencies are used to quantify the effects of temperature differences between test conditions and reporting conditions.1.5 This test method is intended for use with linear photovoltaic devices in which short-circuit is directly proportional to incident irradiance.1.6 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.8 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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1.1 This test method covers a procedure for the determination of a spectral mismatch parameter used in the testing of photovoltaic devices. 1.2 The spectral mismatch parameter is a measure of the error, introduced in the testing of a photovoltaic device, caused by mismatch between the spectral responses of the photovoltaic device and the photovoltaic reference cell, as well as mismatch between the test light source and the reference spectral irradiance distribution to which the photovoltaic reference cell was calibrated. Examples of reference spectral irradiance distributions are Tables E 490, E 891, or E 892. 1.3 The spectral mismatch parameter can be used to correct photovoltaic performance data for spectral mismatch error. 1.4 This test method is intended for use with linear photovoltaic devices. 1.5 There is no similar or equivalent ISO standard. 1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. 1.7 The values stated in SI units are to be regarded as the standard.

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5.1 It is the intent of these test methods to provide a recognized procedure for calibrating, characterizing, and reporting the calibration data for non-primary photovoltaic reference cells that are used during photovoltaic device performance measurements.5.2 The electrical output of photovoltaic devices is dependent on the spectral content of the source illumination and its intensity. To make accurate measurements of the performance of photovoltaic devices under a variety of light sources, it is necessary to account for the error in the short-circuit current that occurs if the relative spectral response of the reference cell is not identical to the spectral response of the device under test. A similar error occurs if the spectral irradiance distribution of the test light source is not identical to the desired reference spectral irradiance distribution. These errors are quantified with the spectral mismatch parameter M (Test Method E973).5.2.1 Test Method E973 requires four quantities for spectral mismatch calculations:5.2.1.1 The quantum efficiency of the reference cell to be calibrated (see 7.1.1),5.2.1.2 The quantum efficiency of the calibration source device (required as part of its calibration),NOTE 1: See 10.10 of Test Method E1021 for the identity that converts spectral responsivity to quantum efficiency.5.2.1.3 The spectral irradiance of the light source (measured with the spectral irradiance measurement equipment), and,5.2.1.4 The reference spectral irradiance distribution to which the calibration source device was calibrated (see G173).5.2.2 Temperature Corrections—Test Method E973 provides means for temperature corrections to short-circuit current using the partial derivative of quantum efficiency with respect to temperature.5.3 A non-primary reference cell is calibrated in accordance with these test methods is with respect to the same reference spectral irradiance distribution as that of the calibration source device. Primary reference cells may be calibrated by use of Test Method E1125.NOTE 2: No ASTM standards for calibration of primary reference cells to the extraterrestrial spectral irradiance distribution presently exist.5.4 A non-primary reference cell should be recalibrated yearly, or every six months if the cell is in continuous use outdoors.5.5 Recommended physical characteristics of reference cells are provided in Specification E1040.5.6 Because silicon solar cells made on p-type substrates are susceptible to a loss of Isc upon initial exposure to light, it is required that newly manufactured reference cells be light soaked, see 4.8.5.7 The choice of natural sunlight versus solar simulation for the test light source involves tradeoffs between the advantages and disadvantages of either source. Natural sunlight provides excellent spatial uniformity over the test plane but the total and spectral irradiances vary with the apparent motion of the sun and changes of atmospheric conditions such as clouds. Calibrations in a solar simulator can be done at any time and provide a stable spectral irradiance. Disadvantages of solar simulators include spatial non-uniformity and short-time variations in total irradiance. The procedures in these test methods have been designed to overcome these disadvantages.1.1 These test methods cover calibration and characterization of non-primary terrestrial photovoltaic reference cells to a desired reference spectral irradiance distribution. The recommended physical requirements for these reference cells are described in Specification E1040. Reference cells are principally used in the determination of the electrical performance of a photovoltaic device.1.2 Non-primary reference cells are calibrated indoors using simulated sunlight or outdoors in natural sunlight by reference to a previously calibrated reference cell, which is referred to as the calibration source device.1.2.1 The non-primary calibration will be with respect to the same reference spectral irradiance distribution as that of the calibration source device.1.2.2 The calibration source device may be a primary reference cell calibrated in accordance with Test Method E1125, or a non-primary reference cell calibrated in accordance with these test methods.1.2.3 For the special case in which the calibration source device is a primary reference cell, the resulting non-primary reference cell is also referred to as a secondary reference cell.1.3 Non-primary reference cells calibrated according to these test methods will have the same radiometric traceability as that of the calibration source device. Therefore, if the calibration source device is traceable to the World Radiometric Reference (WRR, see Test Method E816), the resulting secondary reference cell will also be traceable to the WRR.1.4 These test methods apply only to the calibration of a photovoltaic cell that demonstrates a linear short-circuit current versus irradiance characteristic over its intended range of use, as defined in Test Method E1143.1.5 These test methods apply only to the calibration of a photovoltaic cell that has been fabricated using a single photovoltaic junction.1.6 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.8 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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4.1 The design of a photovoltaic module or system intended to provide safe conversion of the sun's radiant energy into useful electricity must take into consideration the possibility of partial shadowing of the module(s) during operation. This test method describes a procedure for verifying that the design and construction of the module provides adequate protection against the potential harmful effects of hot spots during normal installation and use.4.2 This test method describes a procedure for determining the ability of the module to provide protection from internal defects which could cause loss of electrical insulation or combustion hazards.4.3 Hot spot heating occurs in a module when its operating current exceeds the reduced short-circuit current (ISC) of a shadowed or faulty cell or group of cells. When such a condition occurs, the affected cell or group of cells is forced into reverse bias and must dissipate power, which can cause overheating.NOTE 1: The correct use of bypass diodes can prevent hot spot damage from occurring.4.4 Fig. 1 illustrates the hot spot effect in a module of a series string of cells, one of which, cell Y, is partially shadowed. The amount of electrical power dissipated in Y is equal to the product of the module current and the reverse voltage developed across Y. For any irradiance level, when the reverse voltage across Y is equal to the voltage generated by the remaining (s-1) cells in the module, power dissipation is at a maximum when the module is short-circuited. This is shown in Fig. 1 by the shaded rectangle constructed at the intersection of the reverse I-V characteristic of Y with the image of the forward I-V characteristic of the (s-1) cells.FIG. 1 Hot Spot Effect4.5 Bypass diodes, if present, as shown in Fig. 2, begin conducting when a series-connected string in a module is in reverse bias, thereby limiting the power dissipation in the reduced-output cell.FIG. 2 Bypass Diode EffectNOTE 2: If the module does not contain bypass diodes, check the manufacturer’s instructions to see if a maximum number of series modules is recommended before installing bypass diodes. If the maximum number of modules recommended is greater than one, the hot spot test should be performed with that number of modules in series. For convenience, a constant current power supply may be substituted for the additional modules to maintain the specified current.4.6 The reverse characteristics of solar cells can vary considerably. Cells can have either high shunt resistance where the reverse performance is voltage-limited or have low shunt resistance where the reverse performance is current-limited. Each of these types of cells can suffer hot spot problems, but in different ways.4.6.1 Low Shunt Resistance Cells: 4.6.1.1 The worst case shadowing conditions occur when the whole cell (or a large fraction) is shadowed.4.6.1.2 Often low shunt resistance cells are this way because of localized shunts. In this case hot spot heating occurs because a large amount of current flows in a small area. Because this is a localized phenomenon, there is a great deal of scatter in performance of this type of cell. Cells with the lowest shunt resistance have a high likelihood of operating at excessively high temperatures when reverse biased.4.6.1.3 Because the heating is localized, hot spot failures of low shunt resistance cells occur quickly.4.6.2 High Shunt Resistance Cells: 4.6.2.1 The worst-case shadowing conditions occur when a small fraction of the cell is shadowed.4.6.2.2 High shunt resistance cells limit the reverse current flow of the circuit and therefore heat up. The cell with the highest shunt resistance will have the highest power dissipation.4.6.2.3 Because the heating is uniform over the whole area of the cell, it can take a long time for the cell to heat to the point of causing damage.4.6.2.4 High shunt resistance cells define the need for bypass diodes in the module’s circuit, and their performance characteristics determine the number of cells that can be protected by each diode.4.7 The major technical issue is how to identify the highest and lowest shunt resistance cells and then how to determine the worst-case shadowing for those cells. If the bypass diodes are removable, cells with localized shunts can be identified by reverse biasing the cell string and using an IR camera to observe hot spots. If the module circuit is accessible the current flow through the shadowed cell can be monitored directly. However, many PV modules do not have removable diodes or accessible electric circuits. Therefore a non-intrusive method is needed that can be utilized on those modules.4.8 The selected approach is based on taking a set of I-V curves for a module with each cell shadowed in turn. Fig. 3 shows the resultant set of I-V curves for a sample module. The curve with the highest leakage current at the point where the diode turns on was taken when the cell with the lowest shunt resistance was shadowed. The curve with the lowest leakage current at the point where the diode turns on was taken when the cell with the highest shunt resistance was shadowed.FIG. 3 Module I-V Characteristics with Different Cells Totally Shadowed4.9 If the module to be tested has parallel strings, each string must be tested separately.4.10 This test method may be specified as part of a series of qualification tests including performance measurements and demonstration of functional requirements. It is the responsibility of the user of this test method to specify the minimum acceptance criteria for physical or electrical degradation.1.1 This test method provides a procedure to determine the ability of a photovoltaic (PV) module to endure the long-term effects of periodic “hot spot” heating associated with common fault conditions such as severely cracked or mismatched cells, single-point open circuit failures (for example, interconnect failures), partial (or nonuniform) shadowing, or soiling. Such effects typically include solder melting or deterioration of the encapsulation, but in severe cases could progress to combustion of the PV module and surrounding materials.1.2 There are two ways that cells can cause a hot spot problem: either by having a high resistance so that there is a large resistance in the circuit, or by having a low resistance area (shunt) such that there is a high current flow in a localized region. This test method selects cells of both types to be stressed.1.3 This test method does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this test method.1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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