本标准规定了半导体制冷器制冷性能测试的条件与设备、步骤、数据处理、结果判定及记录报告等内容,适用于该类设备制冷性能测试。旨在规范测试流程,助力企业参与国际贸易,提升产品国际竞争力,确保测试结果准确可靠,为行业提供统一技术依据。Thisstandardspecifiestheconditions,equipment,procedures,dataprocessing,resultevaluation,andrecordingreportsfortherefrigerationperformancetestingofsemiconductorcoolers,andisapplicabletotherefrigerationperformancetestingofsuchdevices.Itaimstostandardizethetestingprocess,assistenterprisesinparticipatingininternationaltrade,enhancetheinternationalcompetitivenessofproducts,ensuretheaccuracyandreliabilityoftestresults,andprovideaunifiedtechnicalbasisfortheindustry.