定价： 82元 / 折扣价： 70 元

The purpose of this guide is to describe the electromagnetic threat posed to electronic equipment and subassemblies by actual Electrostatic Discharge (ESD) events from humans and mobile furnishings. This guide organizes existing data on the subject of ESD in order to characterize the ESD surge environment. This guide is not an ESD test standard. An appropriate ESD test standard should be selected for equipment testing ([1], [3], ). The manufacturing, handling, packaging, and transportation of… read more individual electronic components, including integrated circuits, are not discussed, and this guide does not deal with mobile items such as automobiles, aircraft, or other masses of comparable size. ESD results in a sudden transfer of charge between bodies of differing electrostatic potentials. In this guide, the term ESD includes charge transfer whether or not an arc occurs or is perceived. ESD phenomena generate electromagnetic fields over a broad range of frequencies, from direct current (dc) to low gigahertz. The term ESD event includes not only the discharge current, but also the electromagnetic fields and corona effects before and during a discharge. In this guide the intruder is often a human, but it may be any object that is moved, such as a chair, an equipment cart, a vacuum cleaner, or the equipment victim itself, whether or not it is in conductive contact with a human. The equipment victim is usually a fabricated electronic equipment or subassembly and is generally, although not necessarily, at local electrostatic ground potential. The equipment victim may be the receptor to which the discharge takes place from the intruder; less frequently, the equipment victim may be the intruder. Alternatively, the equipment victim may be affected by the electromagnetic fields generated by a discharge between an intruder and a receptor. Receptors and intruders that may not themselves be equipment victims include furniture such as metal chairs, carts, tables and file cabinets, as well as other electronic equipment. This guide discusses and cites references that describe the ways in which a body builds up charge and the characteristics of discharge currents and fields. Descriptions and references are also given for electrical equivalent circuits to be used in understanding and simulating the discharge current between intruder and receptor masses. Publications that are specifically referenced in the text of the guide are listed in the Section , while Section cites additional publications in both ESD and related areas. Most of the work that has been published in connection with actual ESD is related to discharges from humans, usually grasping or in association with a metal object. Far less published data exists for discharges from humans without metal objects, and from mobile furnishings, and virtually no data exists for discharges from human torsos or clothing. For this reason, primary emphasis is placed on discharges from humans with associated metal objects, with some additional material relating to ESDs from mobile furnishings. All discharges are assumed to take place in an air environment. Finally, all of the published time-domain data on which this guide relies were taken using instrumentation with either a 400 MHz or a 1 GHz bandwidth. read less

定价： 82元 / 折扣价： 70 元

定价： 96元 / 折扣价： 82 元

To describe a process for developing user Open Environment (OSE) profiles, as opposed to standardized profiles. The guide shall include a framework for documenting user requirements, related information technology services, a transition plan, conformance testing and consideration planning considerations, and examples of user organization OSE profiles.

定价： 141元 / 折扣价： 120 元

This guide identifies factors that should be considered in accelerated aging programs and is intended to be supportive of the aging requirements called for in IEEE Std 323-1983 and its subsidiary standards. This guide presents methodologies for conducting accelerated aging tests in which factors of synergistic interactions, radiation dose-rate effects, oxygen diffusion rates, etc., need to be considered. This guide does not define specific requirements for appropriate radiation exposure sources,… read more selection of specific levels of thermal or radiation exposure, or specific properties to be monitored; nor does it make recommendations for sequencing or combining aging stresses for particular materials or circumstances. For such guidance, one should employ the general guidelines herein, supplemented by considerations of the specific equipment and environment, together with prior experience or the experience of others who have published data on the aging of materials closely related to those in question. read less

定价： 150元 / 折扣价： 128 元

This standard defines a framework and architectures for machine learning in which a model is trained using encrypted data that has been aggregated from multiple sources and is processed by a third party trusted execution environment (TEE). A distinctive feature of this technique is the essential use of a third-party TEE for computations. The standard specifies functional components, workflows, security requirements, technicalrequirements, and protocols.

定价： 59元 / 折扣价： 51 元

ABBET will provide standards for an integrated environment, realizing the capabilities of test related standards including, at a minimum, active standards sponsored by the IEEE Standards Coordinating Committee 20. The ABBET family of standards consists of a base standard and a series (P1226.1, etc.) of componet standards and guides. This PAR is for the base standard which represents an overview of ABBET and its architecture. The architecture describes the elements of ABBET and their inter-… read more relationships. The ABBET base standard also establishes guidelines and requirements to govern the elements of the ABBET component standards and guides. read less

定价： 127元 / 折扣价： 108 元

定价： 169元 / 折扣价： 144 元

This is a guide describing the surge voltage, surge current, and TOV environment in low-voltage [up to 1000 V root mean square (rms)] ac power circuits. This scope does not include other power disturbances, such as notches, sags, and noise. The surge considered in this guide do not exceed one-half period of the normal mains waveform (fundamental frequency) in duration. They can be periodic or random events and can appear in any combination of line, neutral, or grounding conductors. They include surges with amplitudes, durations, or rates of change sufficient to cause equipment damage or operational upset (see Figure ). While surge protective devices (SPDs) acting primarily on the amplitude of the voltage are often applied to divert the damaging surges, the upsetting surges may require other remedies. The rationale for including a description of TOVs in this guide on the surge environment is given in .

定价： 175元 / 折扣价： 149 元

This document supports the interest of information developers and associated roles responsible for producing information for users of software and systems developed within an agile environment. This document takes a process standard approach to specify the way in which information for users can be developed in agile development projects. This document provides requirements of information management and information development processes appropriate for software projects that are using agile development methods. Clause 5 covers the overall requirements for information in agile software development. Clause 6 covers requirements for the information development lead or project manager to plan an agile information development project and manage the information development activities in an agile environment. Clause 7 covers requirements for designing, developing, and providing information for users in an agile environment. Annex A describes agile development practices and methods.

定价： 66元 / 折扣价： 57 元

To define the software interface to access Test Equipment Configuration information. This is a component standard of IEEE Standard 1226 9ABBET).

定价： 107元 / 折扣价： 91 元

This guide provides an overview of the basic concepts and intent of ABBET. Specifics of the standards and the implementation of ABBET are found in other IEEE ABBET standards and guides.

定价： 56元 / 折扣价： 48 元

This standard is for a Protection Profile for Hardcopy Devices in a small, private information processing environment in which most elements of security are provided by the physical environment, but basic network security is needed to protect the device and its network from misuse from outside of the environment. Small offices and home offices are typical applications of this environment. This environment will be known as "Operational Environment D."

定价： 103元 / 折扣价： 88 元

This standard defines a standard application programming interface (API) to and a standard appearance and behavior of an X Window System toolkit graphical user interface (Gill) environment based on the OSF/Motij Style Guide {B5} and the Application Environment Specification User Environment Volume {B4}. The standard serves to support application portability at the source-code level and is intended to be used by both application developers and toolkit implementors.

定价： 359元 / 折扣价： 306 元

This standard is for a Protection Profile for Hardcopy Devices in a commercial information processing environment in which a moderate level of document security, network security, and security assurance are required. Typically, the day-to-day proprietary and nonproprietary information needed to operate an enterprise will be handled by this environment. This environment will be known as "Operational Environment B."

定价： 78元 / 折扣价： 67 元