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IEC 60749-18:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
REVISED
发布日期 :
2002-12-13
实施日期 :
IEC 60749-22:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength
现行
发布日期 :
2002-09-12
实施日期 :
IEC 60749-1:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
现行
发布日期 :
2002-08-30
实施日期 :
IEC 60749-8:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
现行
发布日期 :
2002-08-30
实施日期 :
IEC 60749-12:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
REVISED
发布日期 :
2002-04-30
实施日期 :
IEC 60749-6:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
REVISED
发布日期 :
2002-04-12
实施日期 :
IEC 60749-13:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
REVISED
发布日期 :
2002-04-12
实施日期 :
IEC 60749-9:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
REVISED
发布日期 :
2002-04-12
实施日期 :
IEC 60749-2:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
现行
发布日期 :
2002-04-12
实施日期 :
IEC 60749-10:2002 EN-FR
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
REVISED
发布日期 :
2002-04-09
实施日期 :