定价： 515元 / 折扣价： 438 元 加购物车

定价： 590元 / 折扣价： 502 元 加购物车

3.1 This test method provides a satisfactory means of determining various ac magnetic properties of amorphous magnetic materials.3.2 The procedures described herein are suitable for use by producers and users of magnetic materials for materials specification acceptance and manufacturing control.3.3 The procedures described herein may be adapted for use with specimens of other alloys and other toroidal forms.1.1 This test method covers tests for various magnetic properties of amorphous materials at power frequencies [25 to 400 Hz] using a toroidal test transformer. The term “toroidal test transformer” is used to describe the test device, reserving the term “specimen” to refer to the material used in the test. The test specimen consists of toroidally wound flat strip.1.2 This test method covers the determination of core loss, exciting power, rms and peak exciting current, several types of ac permeability, and related properties under ac magnetization at moderate and high inductions at power frequencies [25 to 70 Hz].1.3 With proper instrumentation and specimen preparation, this test method is acceptable for measurements at frequencies from 5 Hz to 100 kHz. Proper instrumentation implies that all test instruments have the required frequency bandwidth. Also see Annex A2.1.4 This test method also provides procedures for calculating impedance permeability from measured values of rms exciting current and for calculating ac peak permeability from measured peak values of total exciting current at magnetic field strengths up to about 10 Oe [796 A/m].1.5 Explanations of symbols and brief definitions appear in the text of this test method. The official symbols and definitions are listed in Terminology A340.1.6 This test method shall be used in conjunction with Practice A34/A34M.1.7 The values and equations stated in customary (cgs-emu and inch-pound) units or SI units are to be regarded separately as standard. Within this standard, SI units are shown in brackets. The values stated in each system may not be exact equivalents; therefore, each system shall be used independently of the other. Combining values from the two systems may result in nonconformance with this standard.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.9 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 590元 / 折扣价： 502 元 加购物车

This test method is intended to provide a means for evaluating the current-voltage cycling stability at 90°C (194°F) of ECWs as described in 1.2.2 ,4 (See Appendix X1, sections X1.4-X1.7.)1.1 This test method covers the accelerated aging and monitoring of the time-dependent performance of electrochromic windows (ECW). Cross sections of typical electrochromic windows have three to five-layers of coatings that include one to three active layers sandwiched between two transparent conducting electrodes (TCEs, see Section ). Examples of the cross-sectional arrangements can be found in "Evaluation Criteria and Test Methods for Electrochromic Windows." (For acronyms used in this standard, see , section ).1.2 This test method is applicable only for layered (one or more active coatings between the TCEs) absorptive electrochromic coatings on sealed insulating glass (IG) units fabricated for vision glass (superstrate and substrate) areas for use in buildings, such as glass doors, windows, skylights, and exterior wall systems. The layers used for electrochromically changing the optical properties may be inorganic or organic materials between the superstrate and substrate.1.3 The electrochromic coatings used in this test method will be subsequently exposed (see Test Methods E 2141) to solar radiation and deployed to control the amount of radiation by absorption and reflection and thus, limit the solar heat gain and amount of solar radiation that is transmitted into the building.1.4 This test method is not applicable to other chromogenic devices, for example, photochromic and thermochromic devices.1.5 This test method is not applicable to electrochromic windows that are constructed from superstrate or substrate materials other than glass.1.6 This test method referenced herein is a laboratory test conducted under specified conditions. This test is intended to simulate and, possibly, to also accelerate actual in-service use of the electrochromic windows. Results from this test cannot be used to predict the performance with time of in-service units unless actual corresponding in-service tests have been conducted and appropriate analyses have been conducted to show how performance can be predicted from the accelerated aging tests.1.7 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

定价： 0元 / 折扣价： 0 元

This test method is intended to provide a means for evaluating the current-voltage cycling stability at ca. 22°C of ECWs as described in 1.2.2 ,4 (See Appendix X1, sections X1.4-X1.7.)1.1 The test described is a method for the accelerated aging and monitoring of the time-dependent performance of electrochromic windows (ECW). Cross sections of typical electrochromic windows have three to five-layers of coatings that include one to three active layers sandwiched between two transparent conducting electrodes (TCEs, see Section ). Examples of the cross-sectional arrangements can be found in "Evaluation Criteria and Test Methods for Electrochromic Windows." (For acronyms used in this standard, see , section ).1.2 The test method is applicable only for layered (one or more active coatings between the TCEs) absorptive electrochromic coatings on sealed insulating glass (IG) units fabricated for vision glass (superstrate and substrate) areas for use in buildings, such as glass doors, windows, skylights, and exterior wall systems. The layers used for electrochromically changing the optical properties may be inorganic or organic materials between the superstrate and substrate.1.3 The electrochromic coatings used in this test method will be subsequently exposed (see Test Methods E 2141) to solar radiation and deployed to control the amount of radiation by absorption and reflection and thus, limit the solar heat gain and amount of solar radiation that is transmitted into the building.1.4 The test method is not applicable to other chromogenic devices, for example, photochromic and thermochromic devices.1.5 The test method is not applicable to electrochromic windows that are constructed from superstrate or substrate materials other than glass.1.6 The test method referenced herein is a laboratory test conducted under specified conditions. This test is intended to simulate and, possibly, to also accelerate actual in-service use of the electrochromic windows. Results from this test cannot be used to predict the performance with time of in-service units unless actual corresponding in-service tests have been conducted and appropriate analyses have been conducted to show how performance can be predicted from the accelerated aging tests.1.7 The values stated in metric (SI) units are to be regarded as the standard.This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

定价： 0元 / 折扣价： 0 元

1. Scope 1.1 This Standard applies to the types of meters and associated devices normally used in the measurement of energy or power or both in the supply and distribution of electricity as a commodity. 1.1.1 This Standard does not provide details

定价： 728元 / 折扣价： 619 元

4.1 Solid-state electronic devices subjected to stresses from excessive current pulses sometimes fail because a portion of the metallization fuses or vaporizes (suffers burnout). Burnout susceptibility can vary significantly from component to component on a given wafer, regardless of design. This practice provides a procedure for establishing the limits of pulse current overstress within which the metallization of a given device should survive.4.2 This practice can be used as a destructive test in a lot-sampling program to determine the boundaries of the safe operating region having desired survival probabilities and statistical confidence levels when appropriate sample quantities and statistical analyses are used.Note 2—The practice may be extended to infer the survivability of untested metallization adjacent to the specimen metallization on a semiconductor die or wafer if care is taken that appropriate similarities exist in the design and fabrication variables.1.1 This practice covers procedures for determining operating regions that are safe from metallization burnout induced by current pulses of less than 1-s duration.Note 1—In this practice, “metallization” refers to metallic layers on semiconductor components such as interconnect patterns on integrated circuits. The principles of the practice may, however, be extended to nearly any current-carrying path. The term “burnout” refers to either fusing or vaporization.1.2 This practice is based on the application of unipolar rectangular current test pulses. An extrapolation technique is specified for mapping safe operating regions in the pulse-amplitude versus pulse-duration plane. A procedure is provided in Appendix X2 to relate safe operating regions established from rectangular pulse data to safe operating regions for arbitrary pulse shapes.1.3 This practice is not intended to apply to metallization damage mechanisms other than fusing or vaporization induced by current pulses and, in particular, is not intended to apply to long-term mechanisms, such as metal migration.1.4 This practice is not intended to determine the nature of any defect causing failure.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

定价： 0元 / 折扣价： 0 元

1.1 This test method covers the measurement of MOSFET (Note 1) drain leakage current.Note 1—MOS is an acronym for metal-oxide semiconductor; FET is an acronym for field-effect transistor.1.2 This test method is applicable to all enhancement-mode and depletion-mode MOSFETs. This test method specifies positive voltage and current, conventions specifically applicable to n-channel MOSFETs. The substitution of negative voltage and negative current makes the method directly applicable to p-channel MOSFETs.1.3 This d-c test method is applicable for the range of drain voltages greater than 0 V but less than the drain breakdown voltage.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

定价： 0元 / 折扣价： 0 元

定价： 646元 / 折扣价： 550 元 加购物车

5.1 Eddy current testing is a nondestructive method of locating discontinuities in a product. Changes in electromagnetic response caused by the presence of discontinuities are detected by the sensor, amplified and modified in order to actuate audio or visual indicating devices, or both, or a mechanical marker. Signals can be caused by outer surface, inner surface, or subsurface discontinuities. The eddy current examination is sensitive to many factors that occur as a result of processing (such as variations in conductivity, chemical composition, permeability, and geometry) as well as other factors not related to the tubing. Thus, all received indications are not necessarily indicative of defective tubing.1.1 This practice2 covers procedures for eddy current examination of seamless and welded tubular products made of relatively low conductivity materials such as titanium, stainless steel, and similar alloys, such as nickel alloys. Austenitic chromium-nickel stainless steels, which are generally considered to be nonmagnetic, are specifically covered as distinguished from the martensitic and ferritic straight chromium stainless steels which are magnetic.1.2 This practice is intended as a guide for eddy current examination of both seamless and welded tubular products using either an encircling coil or a probe-coil technique. Coils and probes are available that can be used inside the tubular product; however, their use is not specifically covered in this document. This type of examination is usually employed only to examine tubing which has been installed such as in a heat exchanger.1.3 This practice covers the examination of tubular products ranging in diameter from 0.125 to 5 in. (3.2 to 127.0 mm) and wall thicknesses from 0.005 to 0.250 in. (0.127 to 6.4 mm).1.4 For examination of aluminum alloy tubular products, see standard Practice E215.1.5 Units—The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.7 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 515元 / 折扣价： 438 元 加购物车

定价： 590元 / 折扣价： 502 元 加购物车

4.1 This practice describes the essential components of the DCP spectrometer. This description allows the user or potential user to gain a basic understanding of this system. It also provides a means of comparing and evaluating this system with similar systems, as well as understanding the capabilities and limitations of each instrument.1.1 This practice describes the components of a direct current plasma (DCP) atomic emission spectrometer. This practice does not attempt to specify component tolerances or performance criteria. This practice does, however, attempt to identify critical factors affecting bias, precision, and sensitivity. Before placing an order a prospective user should consult with the manufacturer to design a testing protocol for demonstrating that the instrument meets all anticipated needs.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazards statements are give in Section 9.1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 590元 / 折扣价： 502 元 加购物车

定价： 481元 / 折扣价： 409 元 加购物车

定价： 590元 / 折扣价： 502 元 加购物车

5.1 This test method for the chemical analysis of titanium and titanium alloys is primarily intended to test material for compliance with specifications of chemical composition such as those under the jurisdiction of ASTM Committee B10. It may also be used to test compliance with other specifications that are compatible with the test method.5.2 It is assumed that all who use this test method will be trained analysts capable of performing common laboratory procedures skillfully and safely and that the work will be performed in a properly equipped laboratory.5.3 This is a performance-based test method that relies more on the demonstrated quality of the test result than on strict adherence to specific procedural steps. It is expected that laboratories using this test method will prepare their own work instructions. These work instructions will include detailed operating instructions for the specific laboratory, the specific reference materials used, and performance acceptance criteria. It is also expected that, when applicable, each laboratory will participate in proficiency test programs, such as described in Practice E2027, and that the results from the participating laboratory will be satisfactory.1.1 This method describes the analysis of titanium and titanium alloys, such as specified by committee B10, by inductively coupled plasma atomic emission spectrometry (ICP-AES) and direct current plasma atomic emission spectrometry (DCP-AES) for the following elements:Element ApplicationRange (wt.%) QuantitativeRange (wt.%)Aluminum 0–8 0.009 to 8.0Boron 0–0.04 0.0008 to 0.01Cobalt 0-1 0.006 to 0.1Chromium 0–5 0.005 to 4.0Copper 0–0.6 0.004 to 0.5Iron 0–3 0.004 to 3.0Manganese 0–0.04 0.003 to 0.01Molybdenum 0–8 0.004 to 6.0Nickel 0–1 0.001 to 1.0Niobium 0-6 0.008 to 0.1Palladium 0-0.3 0.02 to 0.20Ruthenium 0-0.5 0.004 to 0.10Silicon 0–0.5 0.02 to 0.4Tantalum 0-1 0.01 to 0.10Tin 0–4 0.02 to 3.0Tungsten 0-5 0.01 to 0.10Vanadium 0–15 0.01 to 15.0Yttrium 0–0.04 0.001 to 0.004Zirconium 0–5 0.003 to 4.01.2 This test method has been interlaboratory tested for the elements and ranges specified in the quantitative range part of the table in 1.1. It may be possible to extend this test method to other elements or broader mass fraction ranges as shown in the application range part of the table above provided that test method validation is performed that includes evaluation of method sensitivity, precision, and bias. Additionally, the validation study shall evaluate the acceptability of sample preparation methodology using reference materials or spike recoveries, or both. Guide E2857 provides information on validation of analytical methods for alloy analysis.1.3 Because of the lack of certified reference materials (CRMs) containing bismuth, hafnium, and magnesium, these elements were not included in the scope or the interlaboratory study (ILS). It may be possible to extend the scope of this test method to include these elements provided that method validation includes the evaluation of method sensitivity, precision, and bias during the development of the testing method.1.4 Units—The values stated in SI units are to be regarded as the standard. No other units of measurement are included in this standard.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Specific safety hazards statements are given in Section 9.1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

定价： 646元 / 折扣价： 550 元 加购物车