5.1 This test method is intended for application in the semiconductor industry for evaluating the purity of materials (for example, sputtering targets, evaporation sources) used in thin film metallization processes. This test method may be useful in additional applications, not envisioned by the responsible technical committee, as agreed upon between the parties concerned.5.2 This test method is intended for use by GDMS analysts in various laboratories for unifying the protocol and parameters for determining trace impurities in pure titanium. The objective is to improve laboratory to laboratory agreement of analysis data. This test method is also directed to the users of GDMS analyses as an aid to understanding the determination method, and the significance and reliability of reported GDMS data.5.3 For most metallic species the detection limit for routine analysis is on the order of 0.01 weight ppm. With special precautions detection limits to sub-ppb levels are possible.5.4 This test method may be used as a referee method for producers and users of electronic-grade titanium materials.1.1 This test method covers the determination of concentrations of trace metallic impurities in high purity titanium.1.2 This test method pertains to analysis by magnetic-sector glow discharge mass spectrometer (GDMS).1.3 The titanium matrix must be 99.9 weight % (3N-grade) pure, or purer, with respect to metallic impurities. There must be no major alloy constituent, for example, aluminum or iron, greater than 1000 weight ppm in concentration.1.4 This test method does not include all the information needed to complete GDMS analyses. Sophisticated computer-controlled laboratory equipment skillfully used by an experienced operator is required to achieve the required sensitivity. This test method does cover the particular factors (for example, specimen preparation, setting of relative sensitivity factors, determination of sensitivity limits, etc.) known by the responsible technical committee to effect the reliability of high purity titanium analyses.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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1. Scope This standard specifies general and safety requirements for starting devices (starters and ignitors) for tubular fluorescent and other discharge lamps for use on a.c. supplies up to 1 000 V at 50 Hz or 60 Hz which produce starting pulses not g

定价： 910元 / 折扣价： 774 元

5.1 This test method for the chemical analysis of titanium alloys is primarily intended to test material for compliance to compositional requirements of specifications such as those under jurisdiction of ASTM Committee B10. It may also be used to test compliance with other specifications that are compatible with the test method.5.2 This is a performance-based test method that relies more on the demonstrated quality of the test result than on strict adherence to specific procedural steps. It is assumed that all who use this test method will be trained analysts capable of performing common laboratory procedures skillfully and safely, and that the work will be performed in a properly equipped laboratory.5.3 It is expected that laboratories using this test method will prepare their own work instructions. These work instructions will include detailed operating instructions for the specific laboratory, the specific reference materials employed, and performance acceptance criteria.1.1 This test method describes the analysis of titanium and its alloys by spark atomic emission spectrometry (Spark-AES) and glow discharge atomic emission spectrometry (GD-AES). The titanium specimen to be analyzed may be in the form of a disk, casting, foil, sheet, plate, extrusion, or some other wrought form or shape. The elements and ranges covered in the scope by spark-AES of this test method are listed below.Element Tested Mass Fraction Range (%)Aluminum 0.008 to 7.0Chromium 0.006 to 0.1Copper 0.014 to 0.1Iron 0.043 to 0.3Manganese 0.005 to 0.1Molybdenum 0.014 to 0.1Nickel 0.006 to 0.1Silicon 0.018 to 0.1Tin 0.02 to 0.1Vanadium 0.015 to 5.0Zirconium 0.013 to 0.11.1.1 The elements oxygen, nitrogen, carbon, niobium, boron, yttrium, palladium, and ruthenium, were included in the ILS but the data did not contain the required six laboratories. Precision tables were provided for informational use only.1.2 The elements and ranges covered in the scope by GD-AES of this test method are listed below.Element Tested Mass Fraction Range (%)Aluminum 0.02 to 7.0Carbon 0.02 to 0.1Chromium 0.006 to 0.1Copper 0.028 to 0.1Iron 0.09 to 0.3Molybdenum 0.016 to 0.1Nickel 0.006 to 0.1Silicon 0.018 to 0.1Tin 0.022 to 0.1Vanadium 0.054 to 5.0Zirconium 0.026 to 0.11.2.1 The elements boron, manganese, oxygen, nitrogen, niobium, yttrium, palladium, and ruthenium were included in the ILS, but the data did not contain the required six laboratories. Precision tables were provided for informational use only.1.3 The elements and mass fractions given in the above scope tables are the ranges validated through the interlaboratory study. However, it is known that the techniques used in this standard allow the useable range, for the elements listed, to be extended higher or lower based on individual instrument capability, available reference materials, laboratory capabilities, and the spectral characteristics of the specific element wavelength being used. It is also acceptable to analyze elements not listed in 1.1 or 1.2 and still meet compliance to this standard test method. Laboratories must provide sufficient evidence of method validation when extending the analytical range or when analyzing elements not reported in Section 18 (Precision and Bias), as described in Guide E2857.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 9.1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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This test method is intended for application in the semiconductor industry for evaluating the purity of materials (for example, sputtering targets, evaporation sources) used in thin film metallization processes. This test method may be useful in additional applications, not envisioned by the responsible technical committee, as agreed upon between the parties concerned.This test method is intended for use by GDMS analysts in various laboratories for unifying the protocol and parameters for determining trace impurities in copper. The objective is to improve laboratory-to-laboratory agreement of analysis data. This test method is also directed to the users of GDMS analyses as an aid to understanding the determination method, and the significance and reliability of reported GDMS data.For most metallic species, the detection limit for routine analysis is on the order of 0.01 wt. ppm. With special precautions, detection limits to sub-ppb levels are possible.This test method may be used as a referee method for producers and users of electronic-grade copper materials.1.1 This test method covers the concentrations of trace metallic impurities in high purity (99.95 wt. % pure, or purer, with respect to metallic trace impurities) electronic grade copper.1.2 This test method pertains to analysis by magnetic-sector glow discharge mass spectrometer (GDMS).1.3 This test method does not include all the information needed to complete GDMS analyses. Sophisticated computer-controlled laboratory equipment, skillfully used by an experienced operator, is required to achieve the required sensitivity. This test method does cover the particular factors (for example, specimen preparation, setting of relative sensitivity factors, determination of detection limits, and the like) known by the responsible technical committee to effect the reliability of high purity copper analyses.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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1 Scope This standard specifies interchangeable glow-starters used with pre-heat type fluorescent lamps, hereafter called "starters". Section 1 specifies the general and safety requirements with which starters shall comply. Section 2 specifies th

定价： 1593元 / 折扣价： 1355 元

5.1 This test method is intended for application in the semiconductor industry for evaluating the purity of materials (for example, sputtering targets, evaporation sources) used in thin film metallization processes. This test method may be useful in additional applications, not envisioned by the responsible technical committee, as agreed upon between the parties concerned.5.2 This test method is intended for use by GDMS analysts in various laboratories for unifying the protocol and parameters for determining trace impurities in aluminum-copper, aluminum-silicon, and aluminum-copper-silicon alloys. The objective is to improve laboratory-to-laboratory agreement of analysis data. This test method is also directed to the users of GDMS analyses as an aid to understanding the determination method, and the significance and reliability of reported GDMS data.5.3 For most metallic species the detection limit for routine analysis is on the order of 0.01 wt. ppm. With special precautions, detection limits to sub-ppb levels are possible.5.4 This test method may be used as a referee method for producers and users of electronic-grade aluminum-copper, aluminum-silicon and aluminum-copper-silicon materials.1.1 This test method determines the concentrations of trace metallic impurities in high purity (99.99 wt. % pure, or purer, with respect to metallic trace impurities) aluminum-copper, aluminum-silicon and aluminum-copper-silicon alloys with major alloy constituents as follows:  aluminum Greater than 95.0 %  copper Less or equal than 5.0 %  silicon Less or equal than 5.0 %1.2 This test method pertains to analysis by magnetic-sector glow discharge mass spectrometer (GDMS).1.3 This test method does not include all the information needed to complete GDMS analyses. Sophisticated computer-controlled laboratory equipment, skillfully used by an experienced operator, is required to achieve the required sensitivity. This test method does cover the particular factors (for example, specimen preparation, setting of relative sensitivity factors, determination of detection limits, etc.) known by the responsible technical committee to effect the reliability of high purity aluminum analyses.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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5.1 This test method is intended for application in the semiconductor industry for evaluating the purity of materials (for example, sputtering targets, evaporation sources) used in thin film metallization processes. This test method may be useful in additional applications, not envisioned by the responsible technical committee, as agreed upon by the parties concerned.5.2 This test method is intended for use by GDMS analysts in various laboratories for unifying the protocol and parameters for determining trace impurities in pure aluminum. The objective is to improve laboratory to laboratory agreement of analysis data. This test method is also directed to the users of GDMS analyses as an aid to understanding the determination method, and the significance and reliability of reported GDMS data.5.3 For most metallic species the detection limit for routine analysis is on the order of 0.01 weight ppm. With special precautions detection limits to sub-ppb levels are possible.5.4 This test method may be used as a referee method for producers and users of electronic-grade aluminum materials.1.1 This test method covers measuring the concentrations of trace metallic impurities in high purity aluminum.1.2 This test method pertains to analysis by magnetic-sector glow discharge mass spectrometer (GDMS).1.3 The aluminum matrix must be 99.9 weight % (3N-grade) pure, or purer, with respect to metallic impurities. There must be no major alloy constituent, for example, silicon or copper, greater than 1000 weight ppm in concentration.1.4 This test method does not include all the information needed to complete GDMS analyses. Sophisticated computer-controlled laboratory equipment skillfully used by an experienced operator is required to achieve the required sensitivity. This test method does cover the particular factors (for example, specimen preparation, setting of relative sensitivity factors, determination of sensitivity limits, etc.) known by the responsible technical committee to affect the reliability of high purity aluminum analyses.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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5.1 During operation of electrical equipment, including wires, resistors, and other conductors, it is possible for overheating to occur under certain conditions of operation, or when malfunctions occur. When this happens, a possible result is ignition of the adjacent insulation material.5.2 This test method assesses the susceptibility of electrical insulating materials to ignition as a result of exposure to a glowing wire.5.3 This test method determines the minimum temperature required to ignite a material by the effect of a glowing heat source, under the specified conditions of test.5.4 This method is suitable, subject to the appropriate limitations of an expected precision of ±15 %, to categorize materials.5.5 In this procedure, the specimens are subjected to one or more specific sets of laboratory conditions. If different test conditions are substituted or the end-use conditions are changed, it is not always possible by or from this test to predict changes in the fire-test-response characteristics measured. Therefore, the results are valid only for the fire test exposure conditions described in this procedure.1.1 This test method covers the minimum temperature required to ignite insulating materials using a glowing heat source. In a preliminary fashion, this test method differentiates between the susceptibilities of different materials with respect to their resistance to ignition due to an electrically-heated source.1.2 This test method applies to molded or sheet materials available in thicknesses ranging from 0.25 mm to 6.4 mm.1.3 This test method is not valid for determining the ignition behavior of complete electrotechnical equipment, since the design of the electrotechnical product influences the heat transfer between adjacent parts.1.4 This test method measures and describes the response or materials, products, or assemblies to heat and flame under controlled conditions, but does not by itself incorporate all factors required for fire hazard or fire risk assessment of the materials, products, or assemblies under actual fire conditions.1.5 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. (See IEEE/ASTM SI-10 for further details.)For specific precautionary statements, see Section 9.1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For specific precautionary statements, see Section 9.1.7 Fire testing is inherently hazardous. Adequate safeguards for personnel and property shall be employed in conducting these tests.NOTE 1: Although this test method and IEC 60695-2-12 differ in approach and in detail, data obtained to determine the glow-wire flammability index (GWFI) using either test method are technically similar. Although this test method and IEC 60695-2-13 differ in approach and in detail, data obtained to determine the glow-wire ignition temperature (GWIT) using either test method are technically similar.1.8 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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