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【国际标准】 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
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2024-05-13
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标准简介适用范围：
暂无
标准号：
IEC 60749-15:2020 EN-FR
标准名称：
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
英文名称：
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices标准状态：
现行-
发布日期：
2020-07-14 -
实施日期：
出版语种：
EN-FR
- 其它标准
- 上一篇： IEC 60749-15:2010 EN-FR bcebe243 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
- 下一篇： IEC 60749-15:2020 RLV EN 3faac137 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
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