
【国外标准】 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 47/1804/CDV:2005); German version prEN 60749-27:2005
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- DIN EN 60749-27
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- 定价: 486元
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适用范围:
暂无
标准号:
DIN EN 60749-27
标准名称:
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 47/1804/CDV:2005); German version prEN 60749-27:2005
英文名称:
标准状态:
废止-
发布日期:
2001-05-01 -
实施日期:
出版语种:
- 其它标准
- 上一篇: DIN EN 60749-26 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 47/1803/CDV:2005); German version prEN 60749-26:2005
- 下一篇: DIN EN 60749-29 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/1625/CDV:2002); German version prEN 60749-29:2002
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