
【国外标准】 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
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适用范围:
暂无
标准号:
JIS K 0162:2010
标准名称:
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
英文名称:
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters标准状态:
现行-
发布日期:
2010-04-20 -
实施日期:
出版语种:
- 其它标准
- 上一篇: JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
- 下一篇: JIS K 0163:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
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