【国际标准】 Rating systems for electronic tubes and valves and analogous semiconductor devices
本网站 发布时间:
2025-08-20
开通会员免费在线看70000余条国内标准,赠送文本下载次数,单本最低仅合13.3元!还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权!  
查看详情>>
适用范围:
暂无
标准号:
IEC 60134:1961 EN-FR
标准名称:
Rating systems for electronic tubes and valves and analogous semiconductor devices
英文名称:
Rating systems for electronic tubes and valves and analogous semiconductor devices标准状态:
现行-
发布日期:
1961-01-01 -
实施日期:
出版语种:
EN-FR
- 推荐标准
- IEC 60050-521:2002/AMD1:2017 EN-FR 8cc98f28 Amendment 1 - International Electrotechnical Vocabulary - Part 521: Semiconductor devices and integrated circuits
- IEC 60050-521:2002/AMD2:2018 EN-FR 56b750d8 Amendment 2 – International Electrotechnical Vocabulary (IEV) – Part 521: Semiconductor devices and integrated circuits
- IEC 60050-523:2018 EN-FR 8aff8600 International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
- IEC 62779-2:2016 EN-FR 256ed415 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
- IEC 62779-3:2016 EN-FR 76b50c81 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
- IEC 62779-4:2020 EN-FR 0d2fb73f Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
- IEC 62830-4:2019 EN-FR c238d4c0 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
- IEC 62830-5:2021 EN-FR 35ea94fc Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
- IEC 62830-8:2021 EN 3887a05d Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
- IEC 62899-503-1:2020 EN aa0dae33 Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
- IEC 62899-503-3:2021 EN 406fa739 Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
- IEC 62951-2:2019 EN-FR 9bfc77fb Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
- IEC 62951-5:2019 EN-FR be2f0778 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
- IEC 62951-8:2023 EN 033cb72e Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
- IEC 62969-1:2017 EN f07872ae Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors

我的标准
购物车
400-168-0010








