【国外标准】 IEEE Guide on Electrostatic Discharge (ESD): ESD Withstand Capability Evaluation Methods (for Electronic Equipment Subassemblies)

本网站发布时间： 2025-04-28

IEEE C62.38-1994 [ Withdrawn ]
定价： 135元 / 折扣价： 115 元
在线阅读

开通会员免费在线看70000余条国内标准，赠送文本下载次数，单本最低仅合13.3元！还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权！查看详情>>

标准简介

适用范围：

The test methods described are intended to be used to discover subassembly failures that result from destructive ESD, as well as those failures that may result from modification of data stored in subassemblies [e.g., in nonvolatile memory elements such as electronically erasable programmable read-only memory (EEPROM) or battery supported random access memory (RAM)]. This guide does not specify ESD tests to characterize the withstand capability of subassemblies that are incomplete (e.g., in the process of being manufactured), nor the expected ESD immunity of externally powered and/or installed subassemblies. Also, this guide does not specify tests for completed equipment or systems, whether powered or not, nor does it specify ESD tests for individual electronic components, such as integrated circuits. Such ESD tests are covered in other standards (see IEC Pub 801-2 (1991), , , and ).

基本信息

标准号：
IEEE C62.38-1994 [ Withdrawn ]
标准名称：
IEEE Guide on Electrostatic Discharge (ESD): ESD Withstand Capability Evaluation Methods (for Electronic Equipment Subassemblies)
英文名称：
标准状态：
发布日期：
实施日期：
出版语种：

标准分类号

标准ICS号：
中标分类号：

关联标准

替代以下标准：
被以下标准替代：
引用标准：
采用标准：

出版信息

页数：
字数：
开本：

其他信息

起草人：
起草单位：
归口单位：
提出部门：
发布部门：

其它标准

上一篇： IEEE C37.34-1994 IEEE Standard Test Code for High-Voltage Air Switches
下一篇： IEEE 1754-1994 IEEE Standard for a 32-bit Microprocessor Architecture

推荐标准