【国外标准】 IEEE Standard for a Mixed-Signal Test Bus

This standard defines a mixed-signal test bus architecture that provides the means of control and access to both analog and digital test signals such that the testability structure for digital circuits described in IEEE Std 1149.16 has been extended effectively to provide similar facilities for mixed-signal circuits. In addition to testing interconnections in the conventional sense of IEEE Std 1149.1, the mixed-signal test bus defined by this standard also provides the means for parametric… read more testing and, optionally, the means to access internal test structures. The standard does not mandate implementation details of the test circuitry, although examples of conformant implementations are given for illustration. Further, the standard develops extensions to Boundary-Scan Description Language (BSDL) to describe key aspects of implementing this standard within a particular component. At present, the extensions to BSDL defined by this standard specifically omit the description of any and all analog parameters defined by the standard. read less