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【国际标准】 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
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2025-12-20
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标准简介适用范围：
暂无
标准号：
IEC 60749-24:2025 EN
标准名称：
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
英文名称：
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST标准状态：
现行-
发布日期：
2025-11-27 -
实施日期：
出版语种：
EN
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