
【国外标准】 Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 47/2468/CDV:2018); German and English version prEN 60749-18:2018
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2025-04-30
- DIN EN 60749-18
- 废止
- 定价: 748元
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适用范围:
暂无
标准号:
DIN EN 60749-18
标准名称:
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 47/2468/CDV:2018); German and English version prEN 60749-18:2018
英文名称:
标准状态:
废止-
发布日期:
2001-10-01 -
实施日期:
出版语种:
- 其它标准
- 上一篇: DIN EN 60749-17 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 47/1588/CDV:2001); German version prEN 60749-17:2001
- 下一篇: DIN EN 60749-19 Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test (IEC 47/1590/CDV:2001); German version prEN 60749-19:2001
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