- 您的位置:
- 中国标准在线服务网 >>
- 全部标准分类 >>
- 国际标准 >>
- 31.080.99 >>
- IEC 60747-16-1:2001 EN_D 0a296e61
【国际标准】 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
本网站 发布时间:
2024-05-13
开通会员免费在线看70000余条国内标准,赠送文本下载次数,单本最低仅合13.3元!还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权!  
查看详情>>
标准简介
适用范围:
暂无
标准号:
IEC 60747-16-1:2001 EN_D
标准名称:
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
英文名称:
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers标准状态:
现行-
发布日期:
2001-11-20 -
实施日期:
出版语种:
EN_D
- 推荐标准
- 国家标准计划
- IEC 62047-43:2024 EN 7ed4f3fa Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
- IEC 62047-44:2024 EN e9e1115c Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
- IEC 60747-5-16:2023 EN 81db0b13 Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
- IEC 60747-18-5:2023 EN 36ebb031 Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
- IEC 60747-18-4:2023 EN 44797406 Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
- IEC 62951-8:2023 EN 033cb72e Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
- IEC 63364-1:2022 EN-FR b819b0ca Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
- IEC 62951-9:2022 EN 39441942 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
- IEC 60747-16-8:2022 EN-FR 7cf6c6a3 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
- IEC 60747-16-7:2022 EN-FR 08d64839 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
- IEC TR 63357:2022 EN 5464e586 Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles
- IEC 62047-42:2022 EN f9f1b943 Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
- IEC 63068-4:2022 EN 5577f219 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
- IEC 60747-5-14:2022 EN f55ad76c Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
- IEC 63373:2022 EN-FR ee7c7c21 Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices