【国外标准】 Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018); German and English version prEN IEC 60749-20-1:2018

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标准简介

暂无

标准号：
DIN EN IEC 60749-20-1
标准名称：
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018); German and English version prEN IEC 60749-20-1:2018
英文名称：
标准状态：
现行
发布日期：
2001-11-01
实施日期：
出版语种：

DIN EN IEC 60749-20-1