我的标准
购物车
400-168-0010
- 您的位置：
- 中国标准在线服务网 >>
- 全部标准分类 >>
- 国际标准 >>
- 31.140 >>
- IEC TR 60444-4:1988 EN-FR 646162bc Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
【国际标准】 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
本网站 发布时间：
2025-08-20
开通会员免费在线看70000余条国内标准，赠送文本下载次数，单本最低仅合13.3元！还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权！
查看详情>>
标准简介适用范围：
暂无
标准号：
IEC TR 60444-4:1988 EN-FR
标准名称：
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
英文名称：
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz标准状态：
现行-
发布日期：
1988-06-30 -
实施日期：
出版语种：
EN-FR
- 其它标准
- 上一篇： IEC TR 60344:2007 EN 34e81cf0 Calculation of d.c. resistance of plain and coated copper conductors of low-frequency cables and wires - Application guide
- 下一篇： IEC TR 60479-3:1998 EN-FR 4a68b3e4 Effects of current on human beings and livestock - Part 3: Effects of currents passing through the body of livestock
- 推荐标准
- IEC 61837-2:2011 EN-FR ac8770ed Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC 61837-2:2018 EN 9b847751 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC 61837-2:2018/AMD1:2020 EN 04c10f4e Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC 61837-2:2018/AMD1:2020 EN-FR e79f8c5b Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
- IEC 61837-3:2015 EN-FR 4d511c82 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
- IEC 62047-30:2017 EN 82a50db2 Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
- IEC 62047-33:2019 EN ea621cee Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
- IEC 62047-34:2019 EN c830a7c5 Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
- IEC 62276:2012 EN-FR cb8b3f29 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
- IEC 62604-2:2022 EN-FR 91b7c1a4 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
- IEC 62884-2:2017 EN 7b87a9d2 Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 2: Phase jitter measurement method
- IEC 62884-2:2017 EN-FR 9e250648 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
- IEC 62884-3:2018 EN 513a5450 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
- IEC 62884-3:2018 EN-FR 27d65c30 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
- IEC 63041-1:2021 RLV EN b6904df0 Piezoelectric sensors - Part 1: Generic specifications
