
【国外标准】 Semiconductor devices - Visual inspection of discrete semiconductor devices (IEC 47E(Secretariat)6:1994)
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- DIN IEC 47E(Sec)6
- 废止
- 定价: 1351元
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适用范围:
暂无
标准号:
DIN IEC 47E(Sec)6
标准名称:
Semiconductor devices - Visual inspection of discrete semiconductor devices (IEC 47E(Secretariat)6:1994)
英文名称:
标准状态:
废止-
发布日期:
2001-08-01 -
实施日期:
出版语种:
- 其它标准
- 上一篇: DIN IEC 47D(Sec)16 Semiconductor devices, mechanical standardization - Proposed revision of IEC 60191-5: Recommendations applying to automated bonding (TAB) of integrated circuits (IEC 47D(Secretariat)16:1993)
- 下一篇: DIN IEC 52(Sec)472 IEC 61189-2: Test methods for materials for interconnection structures - Test E04: Volume resistivity and surface resistivity (IEC 52(Secretariat)472:1994)
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