【国外标准】 Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)
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2024-02-28
- ASTM F1996-14
- Withdrawn, No replacement
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标准简介
适用范围:
4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.4.2 Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.
标准号:
ASTM F1996-14
标准名称:
Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)
英文名称:
Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)标准状态:
Withdrawn, No replacement-
发布日期:
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实施日期:
出版语种:
- 其它标准
- 上一篇: ASTM F1995-13(2021) Standard Test Method for Determining the Shear Strength of the Bond between a Surface Mount Device (SMD) and Substrate in a Membrane Switch (Withdrawn 2023)
- 下一篇: ASTM F1997-07 Standard Test Method for Determining the Sensitivity (Teasing) of a Tactile Membrane Switch (Withdrawn 2008)
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