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【国外标准】 Information Technology - Card Durability Test Methods

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标准简介标准简介

适用范围:

This American National Standard describes Test Methods for the evaluation of Identification (ID) card durability. An ID card is defined as a card identifying its holder and issuer which may carry data required as input for the intended use of the card. These test methods are to be used by card issuers, card manufacturers and card component suppliers to make comparisons of ID card performance. These test methods do not imply a specific correlation to end use field performance or a given card service life. However, these test methods may be useful for ranking or comparing the relative durability of ID cards. Results obtained by use of these test methods should not be represented as equivalent to field use performance or an absolute index of ultimate card service unless a degree of quantitative correlation has been established for the ID card material construction in question. These test methods do not possess and do not constitute requirements for ID cards in general. The reader is referred to specific application standards for performance requirements and acceptance criteria (INCITS 440). It is the responsibility of card issuers and their suppliers to decide which attributes are required for card performance in a given card application and to mutually agree which test methods may be appropriate to assess card performance. These test methods may involve the use of hazardous materials, operations and equipment. This standard does not purport to address all safety problems associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of local and federal regulatory limitations prior to use

基本信息

  • 标准号:

    INCITS 322-2025

  • 标准名称:

    Information Technology - Card Durability Test Methods

  • 英文名称:

    Information Technology - Card Durability Test Methods
  • 标准状态:

    现行
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