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【国外标准】 Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 7: Determination of CO and H<(Index)2> in nitrogen by gaschromatography and reduction gasdetector
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2025-06-05
- DIN 50450-7
- 废止
- 定价：
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标准简介适用范围：
暂无
标准号：
DIN 50450-7
标准名称：
Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 7: Determination of CO and H<(Index)2> in nitrogen by gaschromatography and reduction gasdetector
英文名称：
标准状态：
废止-
发布日期：
2001-04-01 -
实施日期：
出版语种：
- 其它标准
- 上一篇： DIN 50447 Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
- 下一篇： DIN 50456-2 Characterization of encapsulating compounds for electronic components used in semiconductor technology - Part 2: Determination of ionic impurities using pressure extraction
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