我的标准
购物车
400-168-0010
【国际标准】 Amendment 1 - Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
本网站 发布时间：
2026-02-07
开通会员免费在线看70000余条国内标准，赠送文本下载次数，单本最低仅合13.3元！还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权！
查看详情>>
标准简介适用范围：
暂无
标准号：
IEC 60747-5-13:2021/AMD1:2026 EN
标准名称：
Amendment 1 - Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
英文名称：
Amendment 1 - Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages标准状态：
现行-
发布日期：
2026-01-20 -
实施日期：
出版语种：
EN
- 其它标准
- 上一篇： IEC 62496-4-3:2026 FR 6da7c179 Optical circuit boards - Part 4-3: Interface standards - Terminated waveguide OCB assembly using a single-row thirty-two-channel PMT connector intermateable with a 250 μm pitch MPO 16
- 下一篇： IEC 62841-4-9:2026 FR df1a1e81 Electric motor-operated hand-held tools, transportable tools and lawn and garden machinery - Safety - Part 4-9: Particular requirements for battery-powered chain saws for tree service
- 推荐标准
- IEC 60050-523:2018 EN-FR 8aff8600 International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
- IEC 62384:2020 RLV EN 7d5fa285 DC or AC supplied electronic controlgear for LED modules - Performance requirements
- IEC 62830-4:2019 EN-FR c238d4c0 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
- IEC 62830-5:2021 EN-FR 35ea94fc Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
- IEC 62830-8:2021 EN 3887a05d Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
- IEC 62951-2:2019 EN-FR 9bfc77fb Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
- IEC 62951-5:2019 EN-FR be2f0778 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
- IEC 62951-8:2023 EN 033cb72e Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
- IEC 62969-1:2017 EN f07872ae Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
- IEC 62969-4:2018 EN-FR e49c488a Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
- IEC 63068-2:2019 EN 08fb8ec8 Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
- IEC 63068-3:2020 EN-FR 5c336708 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
- IEC 63068-4:2022 EN 5577f219 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
- IEC 63150-3:2025 EN 3ca43a9d Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 3: Human foot impact motion
- IEC 63229:2021 EN a14f60bc Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
