
【国际标准】 Microbeam analysis — Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
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适用范围:
暂无
标准号:
ISO 15632:2002 EN
标准名称:
Microbeam analysis — Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
英文名称:
Microbeam analysis — Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors标准状态:
废止-
发布日期:
2002-11-25 -
实施日期:
出版语种:
EN
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- 下一篇: ISO 15632:2012 EN 4a2c1822 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis