【国外标准】 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)
本网站 发布时间:
2024-02-28
- ASTM F744M-16
- Withdrawn, No replacement
- 定价: 0元 / 折扣价: 0 元
- 在线阅读
开通会员免费在线看70000余条国内标准,赠送文本下载次数,单本最低仅合13.3元!还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权!  
查看详情>>
标准简介
适用范围:
5.1 Digital integrated circuits are specified to operate with their inputs and outputs in either a logical 1 or a logical 0 state. The occurrence of signals having voltage levels not meeting the specifications of either of these levels (an upset condition) may cause the generation and propagation of erroneous data in a digital system.5.2 Knowledge of the radiation dose rate that causes upset in digital integrated circuits is essential for the design, production, and maintenance of electronic systems that are required to operate in the presence of pulsed radiation environments.1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits only under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation.1.3 The test may be destructive either for further tests or for purposes other than this test if the integrated circuit being tested absorbs a total radiation dose exceeding some predetermined level. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test (6.8).1.4 Setup, calibration, and test circuit evaluation procedures are included in this test method.1.5 Procedures for lot qualification and sampling are not included in this test method.1.6 Because of the variability of the response of different device types, the initial dose rate and device upset conditions for any specific test is not given in this test method but must be agreed upon by the parties to the test.1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
标准号:
ASTM F744M-16
标准名称:
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)
英文名称:
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)标准状态:
Withdrawn, No replacement-
发布日期:
-
实施日期:
出版语种:
- 推荐标准
- 国家标准计划
- 24/30491443 DC standard
- 24/30489392 DC BS EN IEC 62358 Ferrite cores. Standard inductance factor for gapped cores and its tolerance
- BS ISO 19848:2024 - TC Tracked Changes. Ships and marine technology. Standard data for shipboard machinery and equipment
- BS ISO 19848:2024 Ships and marine technology. Standard data for shipboard machinery and equipment
- BS IEC 61360-7:2024 Standard data element types with associated classification scheme
- 24/30487130 DC BS EN 50566:2017/A2:2024 Product standard to demonstrate the compliance of wireless communication
- 24/30486472 DC - Product standard
- KS M ISO 4259-4 석유 및 관련 제품 — 측정 방법과 결과의 정밀도 — 제4부: 개별 실험실에서 표준 시험방법의 실행에 대한 ‘통계적 관리’ 상태를 확인하기 위한 통계적 관리도의 사용
- KS C IEC 61340-4-7 정전기학 — 제4-7부: 구체적 적용 분야에 대한 표준 시험방법 — 이온화
- KS C IEC 61340-4-6 정전기학 — 제4-6부: 구체적 적용 분야에 대한 표준 시험방법 — 손목접지대
- KS C IEC 61340-4-8 정전기학 — 제4-8부: 구체적 적용 분야에 대한 표준 시험방법 — ESD 차폐성 — 봉투
- 24/30485973 DC standard
- BS EN 14662-1:2023 - TC Tracked Changes. Ambient air quality. Standard method for measurement of benzene concentrations
- KS C IEC 61837-2 주파수 제어 및 선택을 위한 표면 실장형 압전 장치 — 표준 아웃라인 및 단자 리드 연결 — 제2부: 세라믹 함체
- BS EN IEC 61753-081-02:2023 Fibre optic interconnecting devices and passive components. Performance standard