- 您的位置:
- 中国标准在线服务网 >>
- 全部标准分类 >>
- 国际标准 >>
- 07.120;07.030 >>
- IEC TS 62607-2-5:2022 EN 109879fd
【国际标准】 Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method
本网站 发布时间:
2024-04-10
开通会员免费在线看70000余条国内标准,赠送文本下载次数,单本最低仅合13.3元!还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权!  
查看详情>>
标准简介
适用范围:
暂无
标准号:
IEC TS 62607-2-5:2022 EN
标准名称:
Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method
英文名称:
Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method标准状态:
现行-
发布日期:
2022-11-08 -
实施日期:
出版语种:
EN
- 推荐标准
- 国家标准计划
- ISO 80004-1:2023 EN 5e403767 Nanotechnologies - Vocabulary - Part 1: Core vocabulary
- ISO 80004-1:2023 FR 5b5aecb9 Nanotechnologies - Vocabulary - Part 1: Core vocabulary
- IEC TS 62607-6-16:2022 EN d866f050 Nanomanufacturing - Key control characteristics - Part 6-16: Two-dimensional materials - Carrier concentration: Field effect transistor method
- IEC TS 62607-2-5:2022 EN 109879fd Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method
- ISO TS 80004-6:2021 FR 38b38304 Nanotechnologies - Vocabulary - Part 6: Nano-object characterization
- ISO TS 80004-6:2021 EN 0b44dcb5 Nanotechnologies - Vocabulary - Part 6: Nano-object characterization
- ISO TS 80004-3:2020 EN 1c66bbd0 Nanotechnologies - Vocabulary - Part 3: Carbon nano-objects
- ISO TS 80004-8:2020 EN 9cebafea Nanotechnologies - Vocabulary - Part 8: Nanomanufacturing processes
- ISO TS 80004-8:2020 FR 657eff13 Nanotechnologies - Vocabulary - Part 8: Nanomanufacturing processes
- ISO TS 80004-3:2020 FR 47bea871 Nanotechnologies - Vocabulary - Part 3: Carbon nano-objects
- IEC TS 62607-6-3:2020 EN 50edda3f Nanomanufacturing - Key control characteristics - Part 6-3: Graphene-based material - Domain size: substrate oxidation
- IEC TS 62607-3-3:2020 EN a6d62d0b Nanomanufacturing - Key control characteristics - Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime of semiconductor quantum dots using time correlated single photon counting (TCSPC)
- IEC TS 62607-5-3:2020 EN f1a72ce7 Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
- IEC TS 62607-2-4:2020 EN a4558db1 Nanomanufacturing - Key control characteristics - Part 2-4: Carbon nanotube materials - Test methods for determination of resistance of individual carbon nanotubes
- IEC TS 62607-4-8:2020 EN 6bd34b0b Nanomanufacturing - Key control characteristics - Part 4-8: Nano-enabled electrical energy storage - Determination of water content in electrode nanomaterials, Karl Fischer method