标准详细信息 去购物车结算

【国外标准】 Standard Practice for Scanning Electron Microscope Beam Size Characterization

本网站 发布时间: 2024-02-28
开通会员免费在线看70000余条国内标准,赠送文本下载次数,单本最低仅合13.3元!还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权!   查看详情>>
标准简介标准简介

适用范围:

4.1 The traditional resolution test of the SEM requires, as a first step, a photomicrograph of a fine particulate sample taken at a high magnification. The operator is required to measure a distance on the photomicrograph between two adjacent, but separate edges. These edges are usually less than one millimetre apart. Their image quality is often less than optimum limited by the S/N ratio of a beam with such a small diameter and low current. Operator judgment is dependent on the individual acuity of the person making the measurement and can vary significantly.4.2 Use of this practice results in SEM electron beam size characterization which is significantly more reproducible than the traditional resolution test using a fine particulate sample.1.1 This practice provides a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized. The resolution of an SEM depends on many factors, some of which are electron beam voltage and current, lens aberrations, contrast in the specimen, and operator-instrument-material interaction. However, the resolution for any set of conditions is limited by the size of the electron beam. This size can be quantified through the measurement of an effective apparent edge sharpness for a number of materials, two of which are suggested. This practice requires an SEM with the capability to perform line-scan traces, for example, Y-deflection waveform generation, for the suggested materials. The range of SEM magnification at which this practice is of utility is from 1000 to 50 000 × . Higher magnifications may be attempted, but difficulty in making precise measurements can be expected.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

基本信息

  • 标准号:

    ASTM E986-04(2017)

  • 标准名称:

    Standard Practice for Scanning Electron Microscope Beam Size Characterization

  • 英文名称:

    Standard Practice for Scanning Electron Microscope Beam Size Characterization
  • 标准状态:

    Active
  • 发布日期:

  • 实施日期:

  • 出版语种:

标准分类号

  • 标准ICS号:

    31.120,37.020
  • 中标分类号:

关联标准

  • 替代以下标准:

  • 被以下标准替代:

  • 引用标准:

  • 采用标准:

出版信息

  • 页数:

    3 页
  • 字数:

  • 开本:

其他信息

  • 起草人:

  • 起草单位:

  • 归口单位:

    E04.11
  • 提出部门:

  • 发布部门:

  • 推荐标准
  • 国家标准计划