
【国外标准】 Semiconductor devices; supplement to IEC 60747-7: bipolar transistors, pulse methods for collector-base cutt-off current and emitter-base cutt-off current (IEC 47E(Secretariat)5:1993)
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- DIN IEC 47E(Sec)5
- 废止
- 定价: 263元
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适用范围:
暂无
标准号:
DIN IEC 47E(Sec)5
标准名称:
Semiconductor devices; supplement to IEC 60747-7: bipolar transistors, pulse methods for collector-base cutt-off current and emitter-base cutt-off current (IEC 47E(Secretariat)5:1993)
英文名称:
标准状态:
废止-
发布日期:
2001-04-01 -
实施日期:
出版语种:
- 其它标准
- 上一篇: DIN IEC 47E(Sec)4 Semiconductor devices; revised and additional measuring methods for microwave field effect transistors; amendment to IEC 47(Central Office)1261 (IEC 47E(Secretariat)4:1993)
- 下一篇: DIN IEC 48B(Sec)300 Electromechanical components for electronic equipment; basic testing procedures and measuring methods; test 11a: climatic sequence (IEC 48B(Secretariat)300:1993)
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