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【国际标准】 Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
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2025-12-13
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标准简介适用范围：
暂无
标准号：
IEC 63616:2025 EN
标准名称：
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
英文名称：
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method标准状态：
现行-
发布日期：
2025-11-28 -
实施日期：
出版语种：
EN
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