【国外标准】 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 47/2027/CDV:2009); German version FprEN 60749-34:2009
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适用范围:
暂无
标准号:
DIN EN 60749-34
标准名称:
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 47/2027/CDV:2009); German version FprEN 60749-34:2009
英文名称:
标准状态:
废止-
发布日期:
2001-10-01 -
实施日期:
出版语种:
英语
- 其它标准
- 上一篇: DIN EN 60749-30/A1 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 47/2019/CDV:2009); German version EN 60749-30:2005/FprA1:2009
- 下一篇: DIN EN 60749-7 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 47/2021/CDV:2009); German version FprEN 60749-7:2009
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