
【国际标准】 Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
本网站 发布时间:
2025-06-18
开通会员免费在线看70000余条国内标准,赠送文本下载次数,单本最低仅合13.3元!还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权!  
查看详情>>

适用范围:
暂无
标准号:
IEC 60747-18-3:2019 EN
标准名称:
Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
英文名称:
Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system标准状态:
现行-
发布日期:
2019-12-11 -
实施日期:
出版语种:
EN
- 其它标准
- 上一篇: IEC 60747-18-2:2020 EN bc5dbdc4 Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules
- 下一篇: IEC 60747-18-4:2023 EN 44797406 Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
- 推荐标准
- IEC 60747-15:2010 EN-FR b5432232 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
- IEC 60747-16-3:2002/AMD1:2009 EN-FR 84d8412e Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
- IEC 60747-16-5:2013 EN-FR 30ec0010 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
- IEC 60747-17:2020 EN 4f1ab007 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
- IEC 60747-5-13:2021 EN 9f31a552 Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
- IEC 60747-5-6:2016 EN-FR 33e768fc Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
- IEC 62031:2008+AMD1:2012+AMD2:2014 CSV EN-FR 4cd2934d LED modules for general lighting - Safety specifications
- IEC 62031:2008/AMD2:2014 EN-FR bd3fb070 Amendment 2 - LED modules for general lighting - Safety specifications
- IEC 62047-14:2012 EN-FR f11d6f75 Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
- IEC 62047-4:2008 EN-FR c3ef8e4a Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
- IEC 60747-14-2:2000 EN d723dc8f Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
- IEC 60747-16-4:2004/AMD2:2017 EN-FR 56a35534 Amendment 2 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
- IEC 60747-18-5:2023 EN 36ebb031 Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
- IEC 62047-11:2013 EN-FR 0a841782 Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
- IEC 62047-27:2017 EN c84fad10 Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)