
【国外标准】 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage (IEC 47/2131/CD:2012)
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2025-06-05
- DIN EN 60749-42
- 废止
- 定价:
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适用范围:
暂无
标准号:
DIN EN 60749-42
标准名称:
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage (IEC 47/2131/CD:2012)
英文名称:
标准状态:
废止-
发布日期:
2001-07-01 -
实施日期:
出版语种:
- 其它标准
- 上一篇: DIN EN 60749-28 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM) (IEC 47/2123/CD:2012)
- 下一篇: DIN EN 61726 Cable assemblies, cables, connectors and passive microwave components - screening attenuation measurement by the reverberation chamber method (IEC 46A/1061/CD:2011)
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