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【国际标准】 Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
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2025-01-04
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标准简介适用范围：
暂无
标准号：
IEC 63003:2015 EN
标准名称：
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
英文名称：
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™标准状态：
现行-
发布日期：
2015-12-14 -
实施日期：
出版语种：
EN
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