您的位置：
中国标准在线服务网 >>
全部标准分类 >>
国外标准 >>
ASTM >>
ASTM F1262M-14 Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)

【国外标准】 Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)

本网站发布时间： 2024-02-28

ASTM F1262M-14
Withdrawn, No replacement
定价： 0元 / 折扣价： 0 元
在线阅读

开通会员免费在线看70000余条国内标准，赠送文本下载次数，单本最低仅合13.3元！还可享标准出版进度查询、定制跟踪推送、标准查新等超多特权！查看详情>>

标准简介

适用范围：

5.1 Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation.1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (matl.)/s.1.1.1 Discussion—This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

基本信息

标准号：
ASTM F1262M-14
标准名称：
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
英文名称：
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
标准状态：
Withdrawn, No replacement
发布日期：
实施日期：
出版语种：

标准分类号

标准ICS号：
中标分类号：

关联标准

替代以下标准：
被以下标准替代：
引用标准：
采用标准：

出版信息

页数：
0 页
字数：
开本：

其他信息

起草人：
起草单位：
归口单位：
提出部门：
发布部门：

其它标准

推荐标准
国家标准计划