【团体标准】 半导体热电致冷器件（TEC）测试方法

本标准涵盖了半导体热电致冷器件多项可靠性测试。包括导线拉力测试，需施加不同方向静负荷并检查引出线；高温存储测试在特定温度下持续一定时间并测试内阻变化；恒定湿热测试于恒温恒湿环境进行；还有电致冷致热交变、耐压力、机械振动等测试，每项测试都有对应的设备、环境、试样制备、步骤及结果评估要求，适用于该器件可靠性测试，确保其在多种条件下性能稳定。Thisstandardcoversmultiplereliabilitytestsforsemiconductorthermoelectriccooling(TEC)devices.Itincludesthewiretensiontest,whichrequiresapplyingstaticloadsindifferentdirectionsandcheckingtheleadwires;thehigh-temperaturestoragetest,whichisconductedataspecifictemperatureforacertainperiodandinvolvestestingtheinternalresistancechange;theconstanttemperatureandhumiditytest,whichiscarriedoutinaconstanttemperatureandhumidityenvironment;aswellastheelectro-coolingandheatingalternatingtest,pressureresistancetest,mechanicalvibrationtest,etc.Eachtesthascorrespondingrequirementsforequipment,environment,samplepreparation,proceduresandresultevaluation,whichisapplicabletothereliabilitytestofthedevicestoensuretheirstableperformanceundervariousconditions.