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【国际标准】 Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
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2025-06-18
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标准简介适用范围：
暂无
标准号：
IEC 60747-18-1:2019 EN
标准名称：
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
英文名称：
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors标准状态：
现行-
发布日期：
2019-05-20 -
实施日期：
出版语种：
EN
- 其它标准
- 上一篇： IEC 60747-17:2020 EN-FR ca7a75bb Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
- 下一篇： IEC 60747-18-2:2020 EN bc5dbdc4 Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules
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