【国外标准】 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 47/1900/CD:2007)
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2025-06-05
- DIN IEC 62047-6
- 废止
- 定价:
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暂无
标准号:
DIN IEC 62047-6
标准名称:
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 47/1900/CD:2007)
英文名称:
标准状态:
废止-
发布日期:
2001-07-01 -
实施日期:
出版语种:
英语
- 其它标准
- 上一篇: DIN IEC 60747-14-5 Semiconductor devices - Discrete devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/326/CD:2007)
- 下一篇: DIN IEC 62148-15 Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages (IEC 86C/744/CD:2007)
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