【国外标准】 American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

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IEEE/ANSI N42.31-2003
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标准简介

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This standard applies to wide-bandgap semiconductor radiation detectors, such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe, referred to herein as CZT), and mercuric iodide (HgI2) used in the detection and measurement of ionizing radiation at room temperature; gamma rays, X-rays, and charged particles are covered. The measurement procedures described herein apply primarily to detector elements having planar, hemispherical, or other geometries in which charge carriers of both… read more polarities contribute to the output signal. When the devices are an integral part of a system, it may not be possible for a user to make tests on the detector alone. In this instance, tests on the detector element must be established by mutual agreement between the manufacturer and the user. read less

基本信息

标准号：
IEEE/ANSI N42.31-2003
标准名称：
American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
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40 页
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