4.1 The traditional resolution test of the SEM requires, as a first step, a photomicrograph of a fine particulate sample taken at a high magnification. The operator is required to measure a distance on the photomicrograph between two adjacent, but separate edges. These edges are usually less than one millimetre apart. Their image quality is often less than optimum limited by the S/N ratio of a beam with such a small diameter and low current. Operator judgment is dependent on the individual acuity of the person making the measurement and can vary significantly.4.2 Use of this practice results in SEM electron beam size characterization which is significantly more reproducible than the traditional resolution test using a fine particulate sample.1.1 This practice provides a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized. The resolution of an SEM depends on many factors, some of which are electron beam voltage and current, lens aberrations, contrast in the specimen, and operator-instrument-material interaction. However, the resolution for any set of conditions is limited by the size of the electron beam. This size can be quantified through the measurement of an effective apparent edge sharpness for a number of materials, two of which are suggested. This practice requires an SEM with the capability to perform line-scan traces, for example, Y-deflection waveform generation, for the suggested materials. The range of SEM magnification at which this practice is of utility is from 1000 to 50 000 × . Higher magnifications may be attempted, but difficulty in making precise measurements can be expected.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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4.1 Different electroplating systems can be corroded under the same conditions for the same length of time. Differences in the average values of the radius or half-width or of penetration into an underlying metal layer are significant measures of the relative corrosion resistance of the systems. Thus, if the pit radii are substantially higher on samples with a given electroplating system, when compared to other systems, a tendency for earlier failure of the former by formation of visible pits is indicated. If penetration into the semi-bright nickel layer is substantially higher, a tendency for earlier failure by corrosion of basis metal is evident.1.1 This test method provides a means for measuring the average dimensions and number of corrosion sites in an electroplated decorative nickel plus chromium or copper plus nickel plus chromium coating on steel after the coating has been subjected to corrosion tests. This test method is useful for comparing the relative corrosion resistances of different electroplating systems and for comparing the relative corrosivities of different corrosive environments. The numbers and sizes of corrosion sites are related to deterioration of appearance. Penetration of the electroplated coatings leads to appearance of basis metal corrosion products.1.2 The values stated in SI units are to be regarded as the standard.1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
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